參數(shù)資料
      型號(hào): MPC930FA
      廠商: FREESCALE SEMICONDUCTOR INC
      元件分類: 時(shí)鐘產(chǎn)生/分配
      英文描述: 140 MHz, PROC SPECIFIC CLOCK GENERATOR, PQFP32
      封裝: TQFP-32
      文件頁數(shù): 11/12頁
      文件大?。?/td> 326K
      代理商: MPC930FA
      MPC930 MPC931
      MOTOROLA ADVANCED CLOCK DRIVERS DEVICE DATA
      56
      the differences between the nominal delays must also be ac-
      counted for.
      When using the MPC931 as a zero delay buffer there is
      more information which can help minimize the overall timing
      uncertainty. To fully minimize the specified uncertainty, it is cru-
      cial that the relative position of the outputs be known. It is rec-
      ommended that if all of the outputs are going to be used that
      the Qc0 output be used as the feedback reference. The Qc0
      output lies in the middle of the other outputs with respect to
      output skew. Therefore it can be assumed that the output to
      output skew of the device is
      ±150ps with respect to output Qc0.
      There will be some cases where only a subset of the outputs
      of the MPC931 are required. There is significantly tighter skew
      performance between outputs on a common bank (i.e., Qa0 to
      Qa1). The skews between these common bank outputs are
      outlined in the table below. In general the skews between out-
      puts on a given bank is about a third of the skew between all
      banks, reducing the skew to a value of 100ps.
      Table 3. Within–Bank Skews
      Outputs
      Relative Skews
      Qa0
      → Qa1
      +35ps,
      ±50ps
      Qb0
      → Qb1
      –30ps,
      ±50ps
      Qc0
      → Qc1
      20ps,
      ±50ps
      Jitter Performance of the MPC930/931
      With the clock rates of today’s digital systems continuing to
      increase more emphasis is being placed on clock distribution
      design and management. Among the issues being addressed
      is system clock jitter and how that affects the overall system
      timing budget. The MPC930/931 was designed to minimize
      clock jitter by employing a differential bipolar PLL as well as
      incorporating numerous power and ground pins in the design.
      The following few paragraphs will outline the jitter performance
      of the MPC930/931, illustrate the measurement limitations and
      provide guidelines to minimize the jitter of the device.
      The most commonly specified jitter parameter is cycle–to–
      cycle jitter. Unfortunately with today’s high performance mea-
      surement equipment there is no way to measure this parame-
      ter for jitter performance in the class demonstrated by the
      MPC930/931. As a result different methods are used which
      approximate cycle–to–cycle jitter. The typical method of mea-
      suring the jitter is to accumulate a large number of cycles,
      create a histogram of the edge placements and record peak–
      to–peak as well as standard deviations of the jitter. Care must
      be taken that the measured edge is the edge immediately fol-
      lowing the trigger edge. If this is not the case the measurement
      inaccuracy will add significantly to the measured jitter. The os-
      cilloscope cannot collect adjacent pulses, rather it collects data
      from a very large sample of pulses. It is safe to assume that
      collecting pulse information in this mode will produce jitter val-
      ues somewhat larger than if consecutive cycles were mea-
      sured, therefore, this measurement will represent an upper
      bound of cycle–to–cycle jitter. Most likely, this is a conservative
      estimate of the cycle–to–cycle jitter.
      1
      212
      12
      Peak-to-Peak PLL Jitter
      Peak-to-Peak Period Jitter
      Figure 11. PLL Jitter and Edge Displacement
      123
      2
      12
      3
      Peak-to-Peak PLL Jitter
      Peak-to-Peak Period Jitter
      There are two sources of jitter in a PLL based clock driver,
      the commonly known random jitter of the PLL and the less
      intuitive jitter caused by synchronous, different frequency out-
      puts switching. For the case where all of the outputs are
      switching at the same frequency the total jitter is exactly equal
      to the PLL jitter. In a device, like the MPC930/931, where a
      number of the outputs can be switching synchronously but at
      different frequencies a “multi–modal” jitter distribution can be
      seen on the highest frequency outputs. Because the output
      being monitored is affected by the activity on the other outputs
      it is important to consider what is happening on those other
      outputs. From Figure 11, one can see for each rising edge on
      the higher frequency signal the activity on the lower frequency
      signal is not constant. The activity on the other outputs tends to
      alter the internal thresholds of the device such that the place-
      ment of the edge being monitored is displaced in time. Be-
      cause the signals are synchronous the relationship is periodic
      and the resulting jitter is a compilation of the PLL jitter superim-
      posed on the displaced edges. When histograms are plotted
      the jitter looks like a “multi–modal” distribution as pictured in
      Figure 11 on page 56. Depending on the size of the PLL jitter
      and the relative displacement of the edges the “multi–modal”
      distribution will appear truly “multi–modal” or simply like a “fat”
      Gaussian distribution. Again note that in the case where all the
      2
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      Freescale Semiconductor, Inc.
      For More Information On This Product,
      Go to: www.freescale.com
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