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參數(shù)資料
| 型號： | MRFI1210-R27JB |
| 廠商： | VENKEL LTD |
| 元件分類： | 通用定值電感 |
| 英文描述： | 1 ELEMENT, 0.27 uH, GENERAL PURPOSE INDUCTOR, SMD |
| 文件頁數(shù)： | 9/9頁 |
| 文件大?。?/td> | 108K |
| 代理商： | MRFI1210-R27JB |
VENKEL CORP
4807 SPICEWOOD SPRINGS ROAD
BUILDING No. 3
AUSTIN, TX 78759
Phone: 512 / 794-0081
Fax: 512 / 794-0087
Toll Free: 800 / 950-8365
e-mail: sales@venkel.com
www.venkel.com
Miniature RF Chip Inductors
General Characteristics
74
Item
Inductance and Tolerance
Condition
Measuring frequency: As shown in Product Table
Measuring temperature: 25°C
Specification
Within specified tolerance
Quality Factor
Measuring frequency: As shown in Product Table
Measuring temperature: 25°C
Within specified tolerance
Insulation Resistance
Measured at 100 VDC between inductor terminal and enclosure.
1000 megaohms minimum
Dielectric Withstanding
Voltage
Measured at 500 VAC between terminal and enclosure
for a maximum of 1 minute.
No damage occurs when
the test voltage is applied.
Temperature Coefficient
of Inductance (TCL)
Over -40°C to +85°C at frequency
specified in Product Table.
+25 to 500 PPM/°C
TCL = L1 - L2 x 10
6
(PPM/°C)
L1 (T1-T2)
Component Adhesion
(PUSH TEST)
The component should be reflow soldered onto a P.C. Board
(230°C 20 seconds) using a dynameter force gauge apply force
to any side of the component.
The component must withstand a minimum
force of 1 Kg for Pt/Ag termination and 2 Kg
for Mo/Mn termination without any failure of
the termination to component attachment.
Thermal Shock Test
Each cycle should consist of 30 minutes at -40°C followed by
30 minutes at +85°C with a 20 second maximum transition time
between temperature extremes. Test duration is 10 cycles.
Change In Inductance:
No more than 5%
Change in Q:
No more than 10%
Solderability
Dip pads in flux and dip in solder pot (63Sn/37Pb)
at 230°C ±5°C for 5 seconds.
A minimum of 95% of the metalized area
being covered with solder.
Resistance to
Soldering Heat
Dip the components into flux and dip into solder pot containing
63Sn/37Pb at 260°C ±5°C for 5 seconds ± 1 second.
Change In Inductance:
No more than 5%
Change In Q:
No more than 10%
Vibration (Random)
Inductors should be randomly vibrated per NAVMAT
P9492 profile. Sample should be subjected to 10-2,000 Hz:
0.04 G/Hz for a minimum of 15 minutes per axis
for each of three axes.
Change In Inductance:
No more than 5%
Change In Q:
No more than 10%
Moisture Resistance
Inductors should be stored in the chamber at 45°C
at 90 - 95% R.H. for 240 hours, and then the inductors
are to be tested after 2 hours at room temperature.
Change In Inductance:
No more than 5%
Change In Q:
No more than 10%
Cold Temperature Storage
Inductors should be stored at a temperature of -40°C
for ±2 hours. Then it should be subjected to standard
atmospheric conditions for 1 hour. After that, measurement
should be made.
Change In Inductance:
No more than 5%
Change In Q:
No more than 10%.
High Temperature Storage
Inductors should be stored at a temperature of 125°C
± 2°C for 48 ± 2 hours. Then it should be subjected to
standard atmospheric conditions for1 hour. After that,
measurement should be made.
Change In Inductance:
No more than 5%
Change In Q:
No more than 10%.
High Temperature
with Load
Inductors should be stored in the chamber at 85°C
for 1000 hours with rated current applied. Inductors should be
tested at the beginning test for 500 hours, 1000 hours, and then
Inductors are to be tested after 2 hours at room temperature.
Change In Inductance:
No more than 5%
Change In Q:
No more than 10%.
Operating Temperature Range
Operating Temperature Range is the range
of ambient temperature at which the inductor
can be operated continuously at rated current.
Temp. Range:
-30°C to + 125°C
Characteristics
Standards Atmospheric Conditions
Unless otherwise specified, the standard range of atmospheric
conditions for making measurements and tests are as follows:
Ambient Temperature:
Relative Humidity:
Air Pressure:
25°C (20°C) ± 2°C
60% to 70%
86 Kpa to 106 Kpa
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