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參數(shù)資料
| 型號： | MTD4N20E1 |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | JFETs |
| 英文描述： | 4 A, 200 V, 1.2 ohm, N-CHANNEL, Si, POWER, MOSFET |
| 封裝： | CASE 369C, DPAK-3 |
| 文件頁數(shù)： | 8/12頁 |
| 文件大?。?/td> | 259K |
| 代理商： | MTD4N20E1 |
MTD4N20E
http://onsemi.com
5
DRAINTOSOURCE DIODE CHARACTERISTICS
Figure 8. GateToSource and DrainToSource
Voltage versus Total Charge
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
Figure 10. Diode Forward Voltage versus Current
QT, TOTAL CHARGE (nC)
18
V DS
,DRAINT
OSOURCE
VOL
TAGE
(VOL
TS)
V GS
,GA
TET
OSOURCE
VOL
TAGE
(VOL
TS)
180
ID = 4 A
TJ = 25°C
QT
Q2
Q3
t,TIME
(ns)
100
10
1
10
100
RG, GATE RESISTANCE (OHMS)
VDD = 100 V
ID = 4 A
VGS = 10 V
TJ = 25°C
td(off)
td(on)
tf
tr
VDS
VSD, SOURCETODRAIN VOLTAGE (VOLTS)
I S
,SOURCE
CURRENT
(AMPS)
VGS = 0 V
TJ = 25°C
Q1
16
14
12
10
8
6
4
2
0
10
8
6
4
2
0
4.0
160
140
120
100
80
60
40
20
0
3.2
2.4
1.6
0.8
0
0.95
0.90
0.85
0.80
0.75
0.70
0.65
0.60
0.55
0.50
VGS
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define the
maximum simultaneous draintosource voltage and drain
current that a transistor can handle safely when it is forward
biased. Curves are based upon maximum peak junction
temperature and a case temperature (TC) of 25°C. Peak
repetitive pulsed power limits are determined by using the
thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal ResistanceGeneral
Data and Its Use.”
Switching between the offstate and the onstate may
traverse any load line provided neither rated peak current
(IDM) nor rated voltage (VDSS) is exceeded and the
transition time (tr,tf) do not exceed 10 s. In addition the total
power averaged over a complete switching cycle must not
exceed (TJ(MAX) TC)/(RθJC).
A Power MOSFET designated EFET can be safely used
in switching circuits with unclamped inductive loads. For
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and adjusted for operating conditions
differing from those specified. Although industry practice is
to rate in terms of energy, avalanche energy capability is not
a constant. The energy rating decreases nonlinearly with an
increase of peak current in avalanche and peak junction
temperature.
Although many EFETs can withstand the stress of
draintosource avalanche at currents up to rated pulsed
current (IDM), the energy rating is specified at rated
continuous current (ID), in accordance with industry
custom. The energy rating must be derated for temperature
as shown in the accompanying graph (Figure 12). Maximum
energy at currents below rated continuous ID can safely be
assumed to equal the values indicated.
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