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參數(shù)資料
| 型號： | N74F367N,602 |
| 廠商： | NXP Semiconductors |
| 文件頁數(shù)： | 5/9頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC BUFFER DVR HEX N-INV 16PDIP |
| 產(chǎn)品培訓模塊： | Logic Packages |
| 標準包裝： | 25 |
| 系列： | 74F |
| 邏輯類型： | 緩沖器/線路驅(qū)動器，非反相 |
| 元件數(shù)： | 2 |
| 每個元件的位元數(shù)： | 2，4（六路） |
| 輸出電流高，低： | 15mA，64mA |
| 電源電壓： | 4.5 V ~ 5.5 V |
| 工作溫度： | 0°C ~ 70°C |
| 安裝類型： | 通孔 |
| 封裝/外殼： | 16-DIP（0.300"，7.62mm） |
| 供應商設備封裝： | 16-DIP |
| 包裝： | 管件 |
| 其它名稱： | 568-3179-5 933747090602 N74F367N |
Philips Semiconductors
Product data
74F367
Hex buffer/driver
2004 Jan 30
5
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
VCC = MIN; VIL = MAX;
± 10% VCC
2.4
–
V
VO
HIGH level output voltage
CC
IL
VIH = MIN; IOH = –3 mA
± 5% VCC
2.7
3.3
–
V
VOH
HIGH-level output voltage
VCC = MIN; VIL = MAX;
± 10% VCC
2.0
–
V
CC
IL
VIH = MIN; IOH = –15 mA
± 5% VCC
2.0
–
V
VO
Low level output voltage
VCC = MIN; VIL = MAX;
± 10% VCC
–
0.55
V
VOL
Low-level output voltage
CC
IL
VIH = MIN; IOL = MAX
± 5% VCC
–
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN; II = IIK
–
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0 V; VI = 7.0 V
–
100
A
IIH
HIGH-level input current
VCC = MAX; VI = 2.7 V
–
20
A
IIL
LOW-level input current
VCC = MAX; VI = 0.5 V
–
–20
A
IOZH
Off-state output current,
HIGH-level voltage applied
VCC = MAX; VO = 2.7 V
–
50
A
IOZL
Off-state output current,
LOW-level voltage applied
VCC = MAX; VO = 0.5 V
–
–50
A
IOS
Short-circuit output current3
VCC = MAX
–100
–
–225
mA
ICCH
–
25
35
mA
ICC
Supply current (total)
ICCL
VCC = MAX
–
47
62
mA
ICCZ
–
35
48
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5 V, Tamb = 25 °C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests.
In any sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
Tamb = +25 °C
Tamb = –55 °C to +125 °C
SYMBOL
PARAMETER
TEST CONDITIONS
VCC = +5.0 V
VCC = +5.0 V ± 10%
UNIT
CL = 50 pF; RL = 500
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
In to Yn
Waveform 1
2.5
4.5
5.5
6.5
7.0
2.0
7.0
7.5
ns
tPZH
tPZL
Output Enable time
to HIGH or LOW level
Waveform 2
Waveform 3
3.0
5.5
6.5
7.5
8.5
3.0
8.5
9.0
ns
tPHZ
tPLZ
Output Disable time
from HIGH to LOW level
Waveform 2
Waveform 3
2.0
4.5
4.0
6.5
2.0
7.0
ns
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相關代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| N74F367N-B | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368D | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368DB | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368D-T | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368N | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:2-Bit/4-Bit Buffer/Driver |
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