參數(shù)資料
型號(hào): NE1619DS,118
廠商: NXP Semiconductors
文件頁數(shù): 14/19頁
文件大?。?/td> 120K
描述: IC TEMP MONITOR 16SSOP
標(biāo)準(zhǔn)包裝: 2,500
功能: 溫度監(jiān)控系統(tǒng)(傳感器)
傳感器類型: 內(nèi)部和外部
感應(yīng)溫度: 0°C ~ 125°C,外部傳感器
精確度: ±3°C 本地(最大),±5°C 遠(yuǎn)程(最大)
拓?fù)洌?/td> ADC,多路復(fù)用器,寄存器庫
輸出類型: SMBus?
輸出警報(bào):
輸出風(fēng)扇:
電源電壓: 2.8 V ~ 5.5 V
工作溫度: 0°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 16-SSOP(0.154",3.90mm 寬)
供應(yīng)商設(shè)備封裝: 16-SSOP
包裝: 帶卷 (TR)
其它名稱: 935264532118
NE1619DS-T
NE1619DS-T-ND
Philips Semiconductors
Product data sheet
NE1619
HECETA4 Temperature and voltage monitor
2004 Oct 05
14
NAND-tree test
A NAND tree is provided in the NE1619 for Automated Test
Equipment (ATE) board level connectivity testing. The device is
placed into NAND tree test mode by powering up with Pin 9
(D/NTEST_IN) held high. In this test mode Pin 16
(A0/RESET
/NTEST_OUT) becomes the NAND-tree output and all
input pins become NAND-tree inputs as illustrated in Figure 12.
To perform a NAND tree test all pins should be initially driven low.
Then one-by-one toggle them high (and keep them high), starting
with the input closest to the output, cycling toward the farthest, the
NAND tree output will toggle with each input change.
SL01232
SDA
SCL
VID4
VID0
VID1
VID2
VID3
NTEST_OUT
Figure 12. NAND-tree circuitry
Table 9.  NAND-tree test vectors
VECTOR #
SDA
SCL
VID0
VID1
VID2
VID3
VID4
NTEST_OUT
1
L
L
L
L
L
L
L
H
2
L
L
L
L
L
L
H
L
3
L
L
L
L
L
H
H
H
4
L
L
L
L
H
H
H
L
5
L
L
L
H
H
H
H
H
6
L
L
H
H
H
H
H
L
7
L
H
H
H
H
H
H
H
8
H
H
H
H
H
H
H
L
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