OP77
Rev. E | Page 10 of 16
TEST CIRCUITS
OP77
200k
VO
50
VOS =
VO
4000
00
32
0-
02
2
Figure 21. Typical Offset Voltage Test Circuit
INPUT REFERRED NOISE =
VO
25,000
00
32
0-
0
23
OP77
2.5M
V+
V–
OUTPUT
100
100
3.3k
4.7F
(
≈10Hz FILTER)
7
6
4
2
3
Figure 22. Typical Low-Frequency Noise Test Circuit
00
32
0-
02
4
OP77
V+
OUTPUT
V–
20k
INPUT
+
–
1
8
7 6
4
2
3
Figure 23. Optional Offset Nulling Circuit
00
32
0-
0
25
OP77
100k
+18V
–18V
7
6
4
2
3
+
10F
+
10F
0.1F
*
10
10
10k
10k
NOTES
*1 PER BOARD
Figure 24. Burn-In Circuit
1M
RL
VX
10
10k
100k
VIN = ±10V
TYPICALPRECISION
OP AMP
VY
VX
–10V
0V
+10V
NOTES
1. GAIN NOT CONSISTANT. CAUSES NONLINEAR ERRORS.
2.AVO SPEC IS ONLY PART OF THE SOLUTION.
3. CHECK SPECIFICATION TABLE 1 AND TABLE 2 FOR PERFORMANCE.
00
32
0-
0
26
AVO
650V/mV
RL = 2k
Figure 25. Open-Loop Gain Linearity
Actual open-loop voltage gain can vary greatly at various output
voltages. All automated testers use endpoint testing and therefore
only show the average gain. This causes errors in high closed-
loop gain circuits. Because this is difficult for manufacturers to
test, users should make their own evaluations. This simple test
circuit makes it easy. An ideal op amp would show a horizontal
scope trace.
VY
VX
–10V
0V
+10V
00
32
0-
02
7
Figure 26. Output Gain Linearity Trace
This is the output gain linearity trace for the new OP77. The
output trace is virtually horizontal at all points, assuring
extremely high gain accuracy. The average open-loop gain is
truly impressive—approximately 10,000,000.