參數(shù)資料
型號： P1300ECRP2
英文描述： MCU CMOS 28LD 20 MHZ 8K FLASH, -40C to +125C, 28-SSOP 208mil, TUBE
中文描述： SIDAC的| 160V五（公報）最大| 800mA的我（縣）|對92VAR
文件頁數(shù)： 86/161頁
文件大小： 986K
代理商： P1300ECRP2
ITU-T K.20 and K.21
SIDACtor
Data Book
4 - 12
Teccor Electronics
(972) 580-7777
External Protectors
For equipment being tested to the exposed level, it is standard practice for external
line protectors (typically gas tubes) to be used in order to handle the large surge
currents generated during K.20 and K.21 qualification. Realizing that these protectors
can affect the characteristics of the EUT, it is important that the protectors used be
agreed upon by the principal parties involved (the equipment supplier and testing
administrator). Once agreed upon, the protectors should be used when primary
protection is specified, and allowance should be given for a new set of protectors after
the completion of each test sequence.
Note:
An alternative to using external protectors is for the test administrator to simulate the
conditions expected (as if the external protectors were used) by modifying the surges
found in K.20 and K.21.
Equipment Boundaries
Because of the numerous types of equipment, during K.20 and K.21 testing ITU-T
looks at each EUT as a
“
black box
”
with three terminals (A, B, and E). The applicant is
expected to define the boundaries of this
“
black box
”
, and in doing so, should be aware
that any protective device within these boundaries is considered an unchangeable part
of that piece of equipment.
Permitted Malfunction or Damage
During K.20 and K.21 qualification, ITU-T recognizes two levels of malfunction or
damage to the EUT:
Level A states that equipment withstands the test without damage or disturbance
and operates properly after the test. If specifically permitted, the administration
may accept the opening of the fuse.
Level B states that a fire hazard does not occur in the equipment as a result of the
test, and that any permanent damage or malfunction is confined to a small number
of external line interface circuits (as defined by the test administrator).
The acceptable level of malfunction for each test is specified under Acceptance
Criteria.
相關PDF資料
PDF描述
P1300SARP MCU CMOS 28LD 20MHZ 8K FLASH, -40C to +85C, 28-SPDIP, TUBE
P1300SBRP SIDAC|160V V(BO) MAX|800MA I(S)|DO-214AA
P1300SCRP SIDAC|160V V(BO) MAX|800MA I(S)|DO-214AA
P1500EARP1 SIDAC|180V V(BO) MAX|800MA I(S)|TO-92VAR
P1500EARP2 SIDAC|180V V(BO) MAX|800MA I(S)|TO-92VAR
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P1300GALRP 功能描述:硅對稱二端開關元件 120V 50A DO15 SIDACtor Bi RoHS:否 制造商:Bourns 轉折電流 VBO:40 V 最大轉折電流 IBO:800 mA 不重復通態(tài)電流: 額定重復關閉狀態(tài)電壓 VDRM:25 V 關閉狀態(tài)漏泄電流（在 VDRM IDRM 下）: 保持電流（Ih 最大值）:50 mA 開啟狀態(tài)電壓:5 V 關閉狀態(tài)電容 CO:120 pF 最大工作溫度:+ 150 C 安裝風格:SMD/SMT 封裝 / 箱體:DO-214AA
P1300GBLRP 功能描述:硅對稱二端開關元件 120V 80A DO15 SIDACtor Bi RoHS:否 制造商:Bourns 轉折電流 VBO:40 V 最大轉折電流 IBO:800 mA 不重復通態(tài)電流: 額定重復關閉狀態(tài)電壓 VDRM:25 V 關閉狀態(tài)漏泄電流（在 VDRM IDRM 下）: 保持電流（Ih 最大值）:50 mA 開啟狀態(tài)電壓:5 V 關閉狀態(tài)電容 CO:120 pF 最大工作溫度:+ 150 C 安裝風格:SMD/SMT 封裝 / 箱體:DO-214AA
P1300Q12ALRP 功能描述:硅對稱二端開關元件 120V 50A QFN 3X3 2L SIDACtor Bi RoHS:否 制造商:Bourns 轉折電流 VBO:40 V 最大轉折電流 IBO:800 mA 不重復通態(tài)電流: 額定重復關閉狀態(tài)電壓 VDRM:25 V 關閉狀態(tài)漏泄電流（在 VDRM IDRM 下）: 保持電流（Ih 最大值）:50 mA 開啟狀態(tài)電壓:5 V 關閉狀態(tài)電容 CO:120 pF 最大工作溫度:+ 150 C 安裝風格:SMD/SMT 封裝 / 箱體:DO-214AA
P1300Q12BLRP 功能描述:硅對稱二端開關元件 120V 100A SIDACtor Bi RoHS:否 制造商:Bourns 轉折電流 VBO:40 V 最大轉折電流 IBO:800 mA 不重復通態(tài)電流: 額定重復關閉狀態(tài)電壓 VDRM:25 V 關閉狀態(tài)漏泄電流（在 VDRM IDRM 下）: 保持電流（Ih 最大值）:50 mA 開啟狀態(tài)電壓:5 V 關閉狀態(tài)電容 CO:120 pF 最大工作溫度:+ 150 C 安裝風格:SMD/SMT 封裝 / 箱體:DO-214AA
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