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參數(shù)資料
| 型號(hào)： | PALCE22V10 |
| 廠商： | Cypress Semiconductor Corp. |
| 元件分類： | PAL |
| 英文描述： | Flash Erasable,Reprogrammable CMOS PAL Device(可擦除閃速，CMOS可重編程PAL器件) |
| 中文描述： | 閃光可擦除，可再編程的CMOS PAL制式設(shè)備（可擦除閃速，可重編程的CMOS器件PAL制式） |
| 文件頁(yè)數(shù)： | 4/12頁(yè) |
| 文件大?。?/td> | 222K |
| 代理商： | PALCE22V10 |
PALCE22V10
4
]
Electrical Characteristics
Over the Operating Range
[2]
]
Parameter
V
OH
Description
Test Conditions
I
OH
=
–
3.2 mA
I
OH
=
–
2 mA
I
OL
= 16 mA
I
OL
= 12 mA
Min.
2.4
Max.
Unit
V
Output HIGH Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
Com
’
l
Mil/Ind
Com
’
l
Mil/Ind
V
OL
Output LOW Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
0.5
V
V
IH
V
IL[4]
I
IX
I
OZ
I
SC
I
CC1
Input HIGH Level
Input LOW Level
Input Leakage Current
Output Leakage Current
Output Short Circuit Current V
CC
= Max., V
OUT
= 0.5V
[5,6]
Standby Power Supply
Current
Guaranteed Input Logical HIGH Voltage for All Inputs
[3]
Guaranteed Input Logical LOW Voltage for All Inputs
[3]
V
SS
< V
IN
< V
CC
, V
CC
= Max.
V
CC
= Max., V
SS
< V
OUT
< V
CC
2.0
–
0.5
–
10
–
40
–
30
V
V
μ
A
μ
A
mA
mA
mA
mA
mA
mA
mA
mA
mA
0.8
10
40
–
130
90
130
120
120
110
140
130
130
V
CC
= Max.,
V
IN
= GND,
Outputs Open in
Unprogrammed
Device
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
Com
’
l
Mil/Ind
I
CC2[6]
Operating Power Supply
Current
V
CC
= Max., V
IL
=
0V, V
IH
= 3V,
Output Open, De-
vice Programmed
as a 10-Bit
Counter,
f = 25 MHz
Com
’
l
Com
’
l
Mil/Ind
Mil/Ind
Capacitance
[6]
Parameter
C
IN
C
OUT
Description
Test Conditions
V
IN
= 2.0V @ f = 1 MHz
V
OUT
= 2.0V @ f = 1 MHz
Min.
Max.
10
10
Unit
pF
pF
Input Capacitance
Output Capacitance
Endurance Characteristics
[6]
Parameter
N
Description
Test Conditions
Normal Programming Conditions
Min.
100
Max.
Unit
Cycles
Minimum Reprogramming Cycles
Notes:
2.
3.
4.
5.
See the last page of this specification for Group A subgroup testing information.
These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
V
(Min.) is equal to -3.0V for pulse durations less than 20 ns.
Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
Tested initially and after any design or process changes that may affect these parameters.
6.
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|---|---|
| PALCE22V10_96 | 制造商:CYPRESS 制造商全稱:Cypress Semiconductor 功能描述:Flash Erasable, Reprogrammable CMOS PAL㈢ Device |
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| PALCE22V10-10JI | 制造商:CYPRESS 制造商全稱:Cypress Semiconductor 功能描述:Flash-erasable Reprogrammable CMOS PAL Device |
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