3.3V, 4-Bit, 2-Port NanoSwitch w/Individual Enables 3 PS8153F 09/09/04
參數資料
型號: PI3B3125LE
廠商: Pericom
文件頁數: 3/6頁
文件大小: 0K
描述: IC 4-BIT BUS SW 2-PORT 14-TSSOP
標準包裝: 96
類型: 總線開關
電路: 1 x 1:1
獨立電路: 4
電壓電源: 單電源
電源電壓: 3.3V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 14-TSSOP(0.173",4.40mm 寬)
供應商設備封裝: 14-TSSOP
包裝: 管件
PI3B3125/PI3B3126
3.3V, 4-Bit, 2-Port NanoSwitch
w/Individual Enables
3
PS8153F
09/09/04
Capacitance (TA = 25°C, f = 1 MHz)
Parameters(4)
Description
Test Conditions
Typ.
Units
CIN
Input Capacitance
VIN = 0V
3.5
pF
COFF
A/B Capacitance, Switch Off
8
Power Supply Characteristics
Parameters
Description
Test Conditions(1)
Min. Typ.(2) Max.
Units
ICC
Quiescent Power Supply Current
VCC = Max. VIN = GND or VCC
0.1
3
A
ΔICC
Supply Current per Input HIGH
VCC = Max. VIN = 3.0V(3)
750
DC Electrical Characteristics (Over the Operating Range, TA = –40°C to +85°C, VCC = 3.3V ±10%)
Parameters
Description
Test Conditions(1)
Min.
Typ.(2) Max. Units
VIH
Input HIGH Voltage
Guaranteed Logic HIGH Level
2.0
V
VIL
Input LOW Voltage
Guaranteed Logic LOW Level
–0.5
0.8
IIH
Input HIGH Current
VCC = Max., VIN = VCC
±1
A
IIL
Input LOW Current
VCC = Max., VIN = GND
±1
IOFF
Off Current
VCC = 0, VOUT = 3 to 3.6V
10
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
–1.2
V
RON
Switch On-Resistance(3)
VCC = Min., VIN = 0.0V, ION = 48mA or 60mA
5
8
Ω
VCC = Min., VIN = 2.4V, ION = 15mA
10
17
Notes:
1.
For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device.
2.
Typical values are at VCC = 3.3V, +25°C ambient.
3.
Per driven input (control inputs only); A and B pins do not contribute to ICC.
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 3.3V, TA = 25°C ambient and maximum loading.
3. Measured by the voltage drop between A and B pin at indicated current through the switch. On-Resistance is determined by the lower of the
voltages on the two (A, B) pins.
4. This parameter is determined by device characterization but is not production tested.
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