
2002 Microchip Technology Inc.
Preliminary
DS41159B-page 333
PIC18FXX8
TABLE 27-2:
DC CHARACTERISTICS: EEPROM AND ENHANCED FLASH
DC Characteristics
Standard Operating Conditions
Param
No.
Sym
Characteristic
Min
Typ
Max
Units
Conditions
Data EEPROM Memory
Byte Endurance
Byte Endurance
V
DD
for Read/Write
D120
D120A
D121
E
D
E
D
V
DRW
100K
10K
V
MIN
1M
100K
—
—
—
5.5
E/W
E/W
V
-40°C to +85°C
+85°C to +125°C
Using EECON to read/write
V
MIN
= Minimum operating voltage
D122
D123
T
DEW
T
RETD
Retention
Erase/Write Cycle Time
—
40
2
—
—
—
ms
Years Provided no specifications are
violated
Cycles -40°C to +85°C
D124
T
REF
Number of Total Erase/Write
Cycles to Data EEPROM before
Refresh*
Number of Total Erase/Write
Cycles to Data EEPROM before
Refresh*
Program Flash Memory
Cell Endurance
Cell Endurance
V
DD
for Read
V
DD
for ISCP Erase
V
DD
for ISCP Write
V
DD
for EECON Erase/Write
1M
10M
—
D124A
T
REF
100K
1M
—
Cycles +85°C to +125°C
D130
D130A
D131
D132
D132A
D132B
E
P
E
P
V
PR
V
IE
V
IW
V
PEW
10K
1000
V
MIN
4.5
4.5
V
MIN
100K
10K
—
—
—
—
—
—
5.5
5.5
5.5
5.5
E/W
E/W
V
V
V
V
-40°C to +85°C
+85°C to +125°C
V
MIN
= Minimum operating voltage
Using ICSP port
Using ICSP port
Using EECON to erase/write
V
MIN
= Minimum operating voltage
V
DD
> 4.5V
V
DD
> 4.5V
D133
D133A
T
IE
T
IW
ICSP Erase Cycle Time
ICSP Erase or Write Cycle Time
(externally timed)
Self-timed Write Cycle Time
T
RETD
Retention
—
1
4
—
—
—
ms
ms
D133B
D134
T
PIW
—
40
2
—
—
—
ms
Years Provided no specifications are
violated
Data in “Typ” column is at 5.0V, 25
°
C unless otherwise stated. These parameters are for design guidance only
and are not tested.
See Section 5.8 for more information.
*