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參數(shù)資料
| 型號(hào)： | PKD01BIFP |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 模擬信號(hào)調(diào)理 |
| 英文描述： | SPECIALTY ANALOG CIRCUIT, PDIP14 |
| 封裝： | PLASTIC, DIP-14 |
| 文件頁數(shù)： | 14/18頁 |
| 文件大?。?/td> | 402K |
| 代理商： | PKD01BIFP |
REV. A
PKD01
–5–
WAFER TEST LIMITS
PKD01N
Parameter
Symbol
Conditions
Limit
Unit
“gm” AMPLIFIERS A, B
Zero-Scale Error
VZS
7mV max
Input Offset Voltage
VOS
6mV max
Input Bias Current
IB
250
nA max
Input Offset Current
IOS
75
nA max
Voltage Gain
AV
RL = 10 k
, VO = ±10 V
10
V/mV min
Common-Mode Rejection Ratio
CMRR
–10 V
≤ VCM ≤ +10 V
74
dB min
Power Supply Rejection Ratio
PSRR
±9 V ≤ V
S
≤ ±18 V
76
dB min
Input Voltage Range
1
VCM
±11.5
V min
Feedthrough Error
VIN = 20 V, DET = 1, RST = 0
66
dB min
COMPARATOR
Input Offset Voltage
VOS
3mV max
Input Bias Current
IB
1000
nA max
Input Offset Current
IOS
300
nA max
Voltage Gain
1
AV
2 k
Pull-Up Resistor to 5 V
3.5
V/mV min
Common-Mode Rejection Ratio
CMRR
–10 V
≤ V
CM
≤ +10 V
82
dB min
Power Supply Rejection Ratio
PSRR
±9 V ≤ VS ≤ ±18 V
76
dB min
Input Voltage Range
1
VCM
±11.5
V min
Low Output Voltage
VOL
ISINK
≤ 5 mA, Logic GND = 5 V
0.4
V max
–0.2
V min
“OFF” Output Leakage Current
IL
VOUT = 5 V
80
A max
Output Short-Circuit Current
ISC
VOUT = 5 V
45
mA min
7
mA min
DIGITAL INPUTS–RST,
DET2
Logic “1” Input Voltage
VH
2V min
Logic “0” Input Voltage
VL
0.8
V max
Logic “1” Input Current
IINH
VH = 3.5 V
1
A max
Logic “0” Input Current
IINL
VL = 0.4 V
10
A max
MISCELLANEOUS
Droop Rate
3
VDR
TJ = 25
°C,
0.1
mV/ms max
TA = 25
°C
0.20
mV/ms max
Output Voltage Swing Amplifier C
VOP
RL = 2.5 k
±11
V min
Short-Circuit Current Amplifier C
ISC
40
mA max
7
mA min
Power Supply Current
ISY
No Load
9
mA max
gm AMPLIFIERS A, B
Slew Rate
SR
0.5
V/
s
Acquisition Time
1
tA
0.1% Accuracy, 20 V Step, AVCL = 1
41
s
tA
0.01% Accuracy, 20 V Step, AVCL = 1
45
s
COMPARATOR
Response Time
5 mV Overdrive, 2 k
Pull-Up Resistor to 5 V
150
ns
MISCELLANEOUS
Switch Aperture Time
tAP
75
ns
Switching Time
tS
50
ns
Buffer Slew Rate
SR
RL = 2.5 k
2.5
V/
s
NOTES
1Guaranteed by design.
2
DET = 1, RST = 0.
3Due to limited production test times, the droop current corresponds to junction temperature (T
J). The droop current vs. time (after power-on) curve clarifies this
point. Since most devices (in use) are on for more than 1 second, ADI specifies droop rate for ambient temperature (T A) also. The warmed-up (TA) droop current
specification is correlated to the junction temperature (TJ) value. ADI has a droop current cancellation circuit that minimizes droop current at high temperature.
Ambient (TA) temperature specifications are not subject to production testing.
(@ VS =
15 V, CH = 1000 pF, TA = 25 C, unless otherwise noted.)
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