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參數(shù)資料
| 型號(hào)： | PLUS16R6-7N |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類(lèi)： | PLD |
| 英文描述： | PAL devices |
| 中文描述： | OT PLD, 10 ns, PDIP20 |
| 文件頁(yè)數(shù)： | 10/16頁(yè) |
| 文件大小： | 160K |
| 代理商： | PLUS16R6-7N |
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Philips Semiconductors Programmable Logic Devices
Product specification
PLUS16R8D/-7 SERIES
PAL devices
16L8, 16R8, 16R6, 16R4
September 10, 1993
45
DC ELECTRICAL CHARACTERISTICS
0
°
C
≤
T
amb
≤
+75
°
C, 4.75
≤
V
CC
≤
5.25V
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
1
MAX
UNIT
Input voltage
2
V
IL
Low
V
CC
= MIN
0.8
V
V
IH
High
V
CC
= MAX
2.0
V
V
IC
Clamp
V
CC
= MIN, I
IN
= –18mA
–0.8
–1.5
V
Output voltage
V
CC
= MIN, V
IN
= V
IH
or V
IL
V
OL
Low
I
OL
= 24mA
0.5
V
V
OH
High
I
OH
= –3.2 mA
2.4
V
Input current
V
CC
= MAX
I
IL
Low
3
V
IN
= 0.40V
–250
μ
A
I
IH
High
3
V
IN
= 2.7V
25
μ
A
I
I
Maximum input current
V
IN
= V
CC
= V
CCMAX
100
μ
A
Output current
V
CC
= MAX
I
OZH
Output leakage
V
OUT
= 2.7V
100
μ
A
I
OZL
Output leakage
V
OUT
= 0.4V
–100
μ
A
I
OS
Short circuit
4, 5
V
OUT
= 0V
–30
–90
mA
I
CC
Capacitance
6
V
CC
supply current
V
CC
= MAX
160
180
mA
C
IN
Input
V
CC
= 5V
V
OUT
= 2.0V
8
pF
C
B
I/O (B)
V
OUT
= 2V, f = 1MHz
8
pF
NOTES:
1. All typical values are at V
= 5V, T
= +25
°
C.
2. All voltage values are with respect to network ground terminal.
3. Leakage current for bidirectional pins is the worst case of I
IL
and I
OZL
or I
IH
and I
OZH
.
4. Test one at a time.
5. Duration of short circuit should not exceed 1 second.
6. These parameters are not 100% tested but periodically sampled.
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| PLUS16R6DA | PAL devices |
| PLUS16R6DN | PAL devices |
| PLUS16R8 | PAL devices |
| PLUS16R8-7A | PAL devices |
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| PLUS16R6DA | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:PAL devices |
| PLUS16R6DN | 制造商:NXP Semiconductors 功能描述: |
| PLUS16R8 | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:PAL devices |
| PLUS16R8-7A | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:PAL devices |
| PLUS16R8-7N | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:PAL devices |
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