Philips Semiconductors
Product specification
PZ5032
32 macrocell CPLD
1997 Feb 20
11
PIN DESCRIPTIONS
PZ5032 – 44-Pin Plastic Leaded Chip Carrier
1
6
7
17
18
28
29
39
40
Pin
Function
IN1
IN3
V
DD
I/O–A0–CK1
I/O–A1
I/O–A2
I/O–A3
I/O–A4
I/O–A5
GND
I/O–A6
I/O–A7
I/O–A8
I/O–A9
V
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Pin
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
Function
I/O–A10
I/O–A11
I/O–A12
I/O–A13
I/O–A14
I/O–A15
GND
V
DD
I/O–B15
I/O–B14
I/O–B13
I/O–B12
I/O–B11
I/O–B10
GND
Pin
31
32
33
34
35
36
37
38
39
40
41
42
43
44
Function
I/O–B9
I/O–B8
I/O–B7
I/O–B6
V
DD
I/O–B5
I/O–B4
I/O–B3
I/O–B2
I/O–B1
I/O–B0
GND
IN0–CK0
IN2–gtsn
PLCC
SP00420
PZ5032 – 44-Pin Thin Quad Flat Package
44
1
11
12
22
23
33
34
Pin
Function
I/O–A3
I/O–A4
I/O–A5
GND
I/O–A6
I/O–A7
I/O–A8
I/O–A9
V
DD
I/O–A10
I/O–A11
I/O–A12
I/O–A13
I/O–A14
I/O–A15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Pin
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
Function
GND
V
DD
I/O–B15
I/O–B14
I/O–B13
I/O–B12
I/O–B11
I/O–B10
GND
I/O–B9
I/O–B8
I/O–B7
I/O–B6
V
DD
I/O–B5
Pin
31
32
33
34
35
36
37
38
39
40
41
42
43
44
Function
I/O–B4
I/O–B3
I/O–B2
I/O–B1
I/O–B0
GND
IN0/CK0
IN2–gtsn
IN1
IN3
V
DD
I/O–A0–CK1
I/O–A1
I/O–A2
TQFP
SP00433
Package Thermal Characteristics
Philips Semiconductors uses the Temperature Sensitive Parameter
(TSP) method to test thermal resistance. This method meets
Mil-Std-883C Method 1012.1 and is described in Philips 1995 IC
Package Databook Thermal resistance varies slightly as a function
of input power. As input power increases, thermal resistance
changes approximately 5% for a 100% change in power.
Figure 7 is a derating curve for the change in
Θ
JA
with airflow based
on wind tunnel measurements. It should be noted that the wind flow
dynamics are more complex and turbulent in actual applications
than in a wind tunnel. Also, the test boards used in the wind tunnel
contribute significantly to forced convection heat transfer, and may
not be similar to the actual circuit board, especially in size.
Package
Θ
JA
44-pin PLCC
49.8
°
C/W
44-pin TQFP
66.3
°
C/W
0
10
20
30
40
50
0
1
2
3
4
5
PERCENTAGE
REDUCTION IN
Θ
JA
(%)
AIR FLOW (m/s)
PLCC/
QFP
SP00419A
Figure 7.
Average Effect of Airflow on
Θ
JA