- 您現(xiàn)在的位置：買(mǎi)賣(mài)IC網(wǎng) > PDF目錄361287 > QL4009-2PF100C (Electronic Theatre Controls, Inc.) 2.2 UF CERAMIC CAPACITOR PDF資料下載
參數(shù)資料
| 型號(hào)： | QL4009-2PF100C |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | 2.2 UF CERAMIC CAPACITOR |
| 中文描述： | 9000可用可編程邏輯門(mén)QuickRAM ESP結(jié)合性能，密度和嵌入式內(nèi)存 |
| 文件頁(yè)數(shù)： | 13/18頁(yè) |
| 文件大?。?/td> | 373K |
| 代理商： | QL4009-2PF100C |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)當(dāng)前第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)
QL4009 QuickRAM Data Sheet Rev B
The 1149.1 standard requires the following three tests:
Extest Instruction.
The Extest instruction performs a PCB interconnect test. This test
places a device into an external boundary test mode, selecting the boundary scan
register to be connected between the TAP's Test Data In (TDI) and Test Data Out (TDO)
pins. Boundary scan cells are preloaded with test patterns (via the Sample/Preload
Instruction), and input boundary cells capture the input data for analysis.
Sample/Preload Instruction.
This instruction allows a device to remain in its
functional mode, while selecting the boundary scan register to be connected between
the TDI and TDO pins. For this test, the boundary scan register can be accessed via a
data scan operation, allowing users to sample the functional data entering and leaving
the device.
Bypass Instruction.
The Bypass instruction allows data to skip a device's boundary
scan entirely, so the data passes through the bypass register. The Bypass instruction
allows users to test a device without passing through other devices. The bypass register
is connected between the TDI and TDO pins, allowing serial data to be transferred
through a device without affecting the operation of the device.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| QL4009-2PF100I | CAP CER 2.2UF 100V X7R 20% 2220 |
| QL4009-2PF100M | 9,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM |
| QL4009-2PF84C | 9,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM |
| QL4009-2PF84I | CAP CER 1.0UF 250V X7R 10% 2220 |
| QL4009-2PF84M | CAP CER .47UF 250V X7R 10% 2220 |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| QL4009-2PF100I | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM |
| QL4009-2PF100M | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM |
| QL4009-2PF84C | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM |
| QL4009-2PF84I | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM |
| QL4009-2PF84M | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。