參數(shù)資料
型號: RFBPF3225150F6-T
英文描述: 2450 MHz, CERAMIC BPF
文件頁數(shù): 4/7頁
文件大小: 474K
代理商: RFBPF3225150F6-T
Page 4 of 7
AS_2.4GHz 3225BPF_A0_05
Sep.-2001
RELIABILITY TEST
n
Mechanical performance
Test item
Solderability
Test condition / Test method
Specification
Solder temp.
: 235
±
5
°
C
Immersion time: 2
±
1 sec
Solder: SN63
At least 95% of a surface of
each terminal electrode must
be covered by fresh solder.
Resistance to soldering heat
Solder: Sn63
Preheating temperature: 150
±
10
°
C
Solder Temperature: 260
±
5
°
C
Immersion time: 10
±
1 sec
Measurement to be made after keeping at room
temp. for 24
±
2 hrs.
No mechanical damage.
Ceramic surface shall not be
exposed in the middle of the
termination or on the
terminated product edge by
leaching.
Drop Test
Height : 75 cm
Direction : 3 directions
Times : 3 times for each direction.
No mechanical damage.
Samples shall satisfy electrical
specification after test.
n
Environmental characteristics
Test item
Humidity (steady conditions)
Test condition / Test method
Humidity:90% to 95% R.H.
Specification
Tempertaure:40
±
2
°
C
Time: 500
±
24 hours.
Measurement: After placing for 24 hours Minimum.
No mechanical damage.
Samples shall satisfy electrical
specification after test.
Temperature cycle
1. 30
±
3 minutes at -40
°
C
±
3
°
C,
2. 10~15 minutes at room temperature,
3. 30
±
3 minutes at +85
°±
3
°
C,
4. 10~15 minutes at room temperature,
Total 100 continuous cycles
Measurement after placing for 48
±
2 hrs min.
No mechanical damage.
Samples shall satisfy electrical
specification after test.
High temperature
Temperature: 85
°
C
±
2
°
C
Test duration: 24 hours
Measurement must be taken after subjection to the
above conditions, followed by exposure in room
environment for 1 to 2 hours.
No mechanical damage.
Samples shall satisfy electrical
specification after test.
Low temperature
Temperature: -40
°
C
±
3
°
C
Test duration: 24 hours
Measurement must be taken after subjection to the
above conditions, followed by exposure in room
environment for 1 to 2 hours.
No mechanical damage.
Samples shall satisfy electrical
specification after test.
相關(guān)PDF資料
PDF描述
RFBPF3225150F6-G 2450 MHz, CERAMIC BPF
RFBPF3225150F6-B 2450 MHz, CERAMIC BPF
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RFBPF3225150F5-T 2450 MHz, CERAMIC BPF
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