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參數(shù)資料
| 型號(hào)： | RH2012M100AS |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | THICK FILM CHIP RESISTORS |
| 中文描述： | 貼片電阻 |
| 文件頁(yè)數(shù)： | 10/12頁(yè) |
| 文件大?。?/td> | 167K |
| 代理商： | RH2012M100AS |
13
ELECTRICAL CHARACTERISTICS
Item
Low Temperature
exposure
|
R :
(3%+0.1
) of the initial value.
Visual : No evidence of mechanical damage.
Dwell in -55
chamber without loading for 1000
12 hours
Dwell for 60 minutes at Room temperature and
Measure resistance value.
Temperature Cycle
|
R :
(1%+0.1
) of the initial value.
Visual : No evidence of mechanical damage.
Perform 100Cycles as follows.
Load Life in
Moisture
Temperature : 40
2
RH : 90~95%
Applying rated voltage for 90 minutes “ON” and
30minutes”O(jiān)FF”
Duration : 1000 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
No.
1
2
3
4
Temperature(
)
-55
3
20
3
125
3
20
3
Time(min)
30
15
30
15
Specification
Test Method
5)*$, '*-. $)*1 3&4*45034
At R 10
|
R :
5%
At R 1
|
R :
(3% + 0.1
)
At R
1
|
R :
5%
Visual : No evidence of mechanical damage.
à
à
Load Life in high
Temperature
Temperature : 70
3
at rated voltage.
Applying rated voltage for 90 minutes “ON” and
30minutes”O(jiān)FF”
Duration : 1000 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
At R 10
|
R :
5%
At R 1
|
R :
(3% + 0.1
)
At R 1
|
R :
5%
à
à
à
Heat Resistance
(High Temperature
Exposure)
Dwell in 125
3
chamber without loading for
1000
12 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
|
R :
(3%+0.1
) of the initial value.
Visual : No evidence of mechanical damage.
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