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參數(shù)資料
| 型號(hào)： | RP104K311B-TR |
| 廠商： | RICOH COMPANY LTD |
| 元件分類： | 固定正電壓?jiǎn)温份敵鯨DO穩(wěn)壓器 |
| 英文描述： | 3.1 V FIXED POSITIVE LDO REGULATOR, 0.32 V DROPOUT, PDSO4 |
| 封裝： | 1 X 1 MM, HALOGEN FREE AND ROHS COMPLIANT, DFN-4 |
| 文件頁數(shù)： | 21/24頁 |
| 文件大?。?/td> | 346K |
| 代理商： | RP104K311B-TR |
RP104x
6
ELECTRICAL CHARACTERISTICS
RP104xxx1B/C/D
VIN
=Set VOUT+1V for VOUT options greater than 1.5V. VIN=2.5V for VOUT ≤ 1.5V.
IOUT
=1mA, CIN=COUT=0.1μF, unless otherwise noted.
values indicate
40°C ≤ Topt ≤ 85°C, unless otherwise noted.
Topt
=25°C
Symbol
Item
Conditions
Min.
Typ.
Max.
Unit
VOUT > 2.0V
×0.992
×1.008
V
Topt
=25°C
VOUT
≤ 2.0V
16
+16
mV
VOUT > 2.0V
×0.985
×1.015
V
VOUT
Output Voltage
40°C ≤ Topt ≤ 85°C
VOUT
≤ 2.0V
30
+30
mV
IOUT
Output Current
150
mA
ΔVOUT/ΔIOUT Load Regulation
1mA
≤ IOUT ≤ 150mA
10
20
mV
1.2V
≤ VOUT < 1.5V
0.76
1.05
1.5V
≤ VOUT < 1.7V
0.53
0.80
1.7V
≤ VOUT < 2.0V
0.44
0.65
2.0V
≤ VOUT < 2.5V
0.34
0.50
2.5V
≤ VOUT < 2.8V
0.28
0.40
VDIF
Dropout Voltage
IOUT
=150mA
2.8V
≤ VOUT ≤ 3.3V
0.24
0.32
V
ISS
Supply Current
IOUT
=0mA
1.0
1.5
μA
Istandby
Standby Current
VCE
=0V
0.1
1.0
μA
ΔVOUT/ΔVIN Line Regulation
Set VOUT
+0.5V ≤ VIN ≤ 5.0V
0.02
0.10
%/V
VIN
Input Voltage
1.7
5.25
V
ΔVOUT/
ΔTopt
Output Voltage
Temperature Coefficient
40°C ≤ Topt ≤ 85°C
±40
ppm
/
ISC
Short Current Limit
VOUT
=0V
40
mA
IPD
CE Pull-down Current
0.3
μA
VCEH
CE Input Voltage "H"
1.5
V
VCEL
CE Input Voltage "L"
0.3
V
RLOW
Low Output Nch Tr. ON
Resistance (of D version)
VIN
=4.0V
VCE
=0V
30
Ω
All of units are tested and specified under load conditions such that Tj≈Topt
=25°C except for Output Voltage
Temperature Coefficient.
) When Input Voltage is 5.5V, the total operational time must be within 500hrs.
RECOMMENDED OPERATING CONDITIONS
(ELECTRICAL CHARACTERISTICS)
All of electronic equipment should be designed that the mounted semiconductor devices operate within the
recommended operating conditions. The semiconductor devices cannot operate normally over the
recommended operating conditions, even if when they are used over such conditions by momentary
electronic noise or surge. And the semiconductor devices may receive serious damage when they continue
to operate over the recommended operating conditions.
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