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參數(shù)資料
| 型號(hào)： | RTS3700B |
| 英文描述： | 8-bit MCU Based Generic Integrated System |
| 中文描述： | 8位微控制器的通用集成系統(tǒng) |
| 文件頁(yè)數(shù)： | 4/13頁(yè) |
| 文件大?。?/td> | 376K |
| 代理商： | RTS3700B |
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RTS3700B
V1.1
2000/11/1
LCD_DO4-0
O
Serial data output (or Nibble) for LCD driver
Serial mode: LCD_DO0 is the serial data output and others are not used.
Parallel mode: LCD_DO3~0 are the segment data output and LCD_DO4 is
common data output.
LCD_LD
O
Latch data signal for LCD
LCD_POL
O
LCD display phase control (frame waveform polarity)
UART_CK
O
Serial clock out for UART (open-drain). An external pull-up resistor(4.7K
)
is necessary.
TXD
O
Transmitter
output
for
UART
(open-drain).
An
external
pull-up
resistor(4.7K
) is necessary.
RXD
I
Receiver input for UART, built-in Schmitt trigger circuit. An external pull-up
resistor is necessary.
ADR_LD
O
Address latch signal for CMOS sensor interface.
A23- A0
Tri-O
External ROM address bus with tri-state capability.
D7 - D0
Tri-I/O
External data bus with tri-state capability.
EVENB
I
Input signal to disable internal ROM for identifying the ROM data while
developing program.
EVROMCSB
O
Chip selection signal to an external ROM which is instead of internal ROM
MEMCSB3~0
Tri-O
External memory 4~1 chip selection signal, with tri-state capability
RDB
Tri-O
External memory read signal, with tri-state capability.
WRB
Tri-O
External RAM write signal, with tri-state capability.
VIN
I
Analog input to detect the voltage level of battery
BDM_RSTB
I
Test pin for debugging. An internal pull-up resistor (100K
) is built-in. Leave
this pin floating under normal run.
BDM_SDI
I
Test pin for debugging. An internal pull-up resistor (100K
) is built-in. Leave
this pin floating under normal run.
BDM_SDO
O
Test pin for debugging. Leave this pin floating under normal run.
BDM_SCLK
O
Test pin for debugging. Leave this pin floating under normal run.
BDM_EMU
O
Test pin for debugging. Leave this pin floating under normal run.
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