參數(shù)資料
型號(hào): SCAN15MB200
廠商: National Semiconductor Corporation
英文描述: Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6
中文描述: 雙1.5 Gbps 2:1 / 1:2 LVDS的復(fù)用器/緩沖器與預(yù)加重和IEEE 1149.6
文件頁數(shù): 8/12頁
文件大?。?/td> 599K
代理商: SCAN15MB200
Electrical Characteristics
(Continued)
Over recommended operating supply and temperature ranges unless other specified.
Symbol
Parameter
Conditions
Min
Typ
(Note 9)
Max
Units
SWITCHING CHARACTERISTICS - SCAN FEATURES
f
MAX
Maximum TCK Clock Frequency
t
S
TDI to TCK, H or L
t
H
TDI to TCK, H or L
t
S
TMS to TCK, H or L
t
H
TMS to TCK, H or L
t
W
TCK Pulse Width, H or L
t
W
TRST Pulse Width, L
t
REC
Recovery Time, TRST to TCK
R
L
= 500
,
C
L
= 35 pF
25.0
3.0
0.5
3.0
0.5
10.0
2.5
2.0
MHz
ns
ns
ns
ns
ns
ns
ns
Note 9:
Typical parameters are measured at V
DD
= 3.3V, T
A
= 25C. They are for reference purposes, and are not production-tested.
Note 10:
Differential output voltage V
OD
is defined as ABS(OUT+–OUT). Differential input voltage V
ID
is defined as ABS(IN+–IN).
Note 11:
Output offset voltage V
OS
is defined as the average of the LVDS single-ended output voltages at logic high and logic low states.
Note 12:
Jitter is not production tested, but guaranteed through characterization on a sample basis.
Note 13:
Random Jitter, or RJ, is measured RMS with a histogram including 1500 histogram window hits. The input voltage = V
ID
= 500mV, 50% duty cycle at
750MHz, t
r
= t
f
= 50ps (20% to 80%).
Note 14:
Deterministic Jitter, or D
J
, is measured to a histogram mean with a sample size of 350 hits. Stimulus and fixture jitter has been subtracted. The input
voltage = V
ID
= 500mV, K28.5 pattern at 1.5 Gbps, t
r
= t
f
= 50ps (20% to 80%). The K28.5 pattern is repeating bit streams of (0011111010 1100000101).
Note 15:
Total Jitter, or T
J
, is measured peak to peak with a histogram including 3500 window hits. Stimulus and fixture jitter has been subtracted. The input voltage
= V
ID
= 500mV, 2
PRBS pattern at 1.5 Gbps, t
r
= t
f
= 50ps (20% to 80%).
Note 16:
Not Production tested. Guaranteed by statistical analysis on a sample basis at the time of characterization.
S
www.national.com
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