參數(shù)資料
型號： SD-14531F1-344S
廠商： DATA DEVICE CORP
元件分類： 位置變換器
英文描述： SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
封裝： CERAMIC, FP-36
文件頁數(shù)： 7/16頁
文件大小： 170K
代理商： SD-14531F1-344S
15
Data Device Corporation
www.ddc-web.com
SD-14531
ORDERING INFORMATION
(see TABLE 8 for reference and signal transformer ordering information)
SD-14531XX-XXXX
Supplemental Process Requirements:
S = Pre-Cap Source Inspection
L = Pull Test
Q = Pull Test and Pre-Cap Inspection
K = One Lot Date Code
W = One Lot Date Code and PreCap Source
Y = One Lot Date Code and 100% Pull Test
Z = One Lot Date Code, PreCap Source and 100% Pull Test
Blank = None of the Above
Accuracy:
2 = ±5.2 Minutes
4 = ±2.6 Minutes
5 = ±1.3 Minutes Resolver Mode, ±1.6 Minutes Synchro Mode (16-Bit Mode only)
Process Requirements:
0 = Standard DDC Processing, no Burn-In (See table below.)
1 = MIL-PRF-38534 Compliant
2 = B*
3 = MIL-PRF-38534 Compliant with PIND Testing
4 = MIL-PRF-38534 Compliant with Solder Dip
5 = MIL-PRF-38534 Compliant with PIND Testing and Solder Dip
6 = B* with PIND Testing
7 = B* with Solder Dip
8 = B* with PIND Testing and Solder Dip
9 = Standard DDC Processing with Solder Dip, no Burn-In (See table below.)
Temperature Grade/Data Requirements:
1 = -55°C to +125°C
2 = -40°C to +85°C
3 = 0°C to +70°C
4 = -55°C to +125°C with Variables Test Data
5 = -40°C to +85°C with Variables Test Data
8 = 0°C to +70°C with Variables Test Data
Input:
1 = 11.8/400 Hz
2 = 90/400 Hz
3 = 90/60 Hz
4 = Direct/400 Hz
5 = Direct/60 Hz
Package:
D = DIP
F = Flat Pack (Consult factory for availability.)
*Standard DDC Processing with burn-in and full temperature test — see table below.
—
1015, Table 1
BURN-IN
A
2001
CONSTANT ACCELERATION
C
1010
TEMPERATURE CYCLE
A and C
1014
SEAL
—
2009, 2010, 2017, and 2032
INSPECTION
CONDITION(S)
METHOD(S)
TEST
MIL-STD-883
STANDARD DDC PROCESSING
相關PDF資料
PDF描述
SD-14531F1-354K SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
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