參數(shù)資料
型號: SD-14590D4-162S
廠商: DATA DEVICE CORP
元件分類: 位置變換器
英文描述: SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, MDMA36
封裝: DIP-36
文件頁數(shù): 3/12頁
文件大小: 120K
代理商: SD-14590D4-162S
11
ORDERING INFORMATION
XX-1459XXX-XXXX
Supplemental Process Requirements:
S = Pre-Cap Source Inspection
L = Pull Test
Q = Pull Test and Pre-Cap Inspection
Blank = None of the Above
Accuracy:
2 = ±5.2 Minutes
4 = ±2.6 Minutes
5 = ±1.3 Minutes (16 Bit only)
Process Requirements:
0 = Standard DDC Processing, no Burn-In (See table below.)
1 = MIL-PRF-38534 Compliant
2 = B*
3 = MIL-PRF-38534 Compliant with PIND Testing
4 = MIL-PRF-38534 Compliant with Solder Dip
5 = MIL-PRF-38534 Compliant with PIND Testing and Solder Dip
6 = B* with PIND Testing
7 = B* with Solder Dip
8 = B* with PIND Testing and Solder Dip
9 = Standard DDC Processing with Solder Dip, no Burn-In (See table below.)
Temperature Grade/Data Requirements:
1 = -55°C to +125°C
2 = -40°C to +85°C
3 = 0°C to +70°C
4 = -55°C to +125°C with Variables Test Data
5 = -40°C to +85°C with Variables Test Data
8 = 0°C to +70°C with Variables Test Data
Input:
1 = 11.8/400 Hz
2 = 90/400 Hz
3 = 90/60 Hz
4 = Direct/400 Hz
5 = Direct/60 Hz
Package:
D = DIP
F = Flat Pack (Consult factory for availability.)
Resolution:
0 = Programmable (14 or 16 Bits)
1 = 14 Bit
2 = 16 Bit
Input Type:
RD = Resolver Input
SD = Synchro Input
XD = Direct Input
*Standard DDC Processing with burn-in and full temperature test — see table below.
1015, Table 1
BURN-IN
A
2001
CONSTANT ACCELERATION
C
1010
TEMPERATURE CYCLE
A and C
1014
SEAL
2009, 2010, 2017, and 2032
INSPECTION
CONDITION(S)
METHOD(S)
TEST
MIL-STD-883
STANDARD DDC PROCESSING
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