參數資料
型號: SDC-14610-162Z
廠商: DATA DEVICE CORP
元件分類: 位置變換器
英文描述: SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36
封裝: 1.700 X 0.780 INCH, 0.210 INCH HEIGHT, DDIP-36
文件頁數: 6/8頁
文件大?。?/td> 116K
代理商: SDC-14610-162Z
6
Data Device Corporation
www.ddc-web.com
SDC-14610/15 Series
ORDERING INFORMATION
SDC-1461XX-XXXX
Supplemental Process Requirements:
S = Pre-Cap Source Inspection
L = Pull Test
Q = Pull Test and Pre-Cap Inspection
K = One Lot Date Code
W = One Lot Date Code and PreCap Source
Y = One Lot Date Code and 100% Pull Test
Z = One Lot Date Code, PreCap Source and 100% Pull Test
Blank = None of the Above
Accuracy:
2 = 4 minutes + 1 LSB
4 = 2 minutes + 1 LSB (Not available with 14-bit units.)
5 = 1 minute + 1 LSB (Available with “S” option only.)
Process Requirements:
0 = Standard DDC Processing, no Burn-In (See TABLE 3)
1 = MIL-PRF-38534 Compliant
2 = B*
3 = MIL-PRF-38534 Compliant with PIND Testing
4 = MIL-PRF-38534 Compliant with Solder Dip
5 = MIL-PRF-38534 Compliant with PIND Testing and Solder Dip
6 = B* with PIND Testing
7 = B* with Solder Dip
8 = B* with PIND Testing and Solder Dip
9 = Standard DDC Processing with Solder Dip, no Burn-In (See TABLE 3)
Temperature Grade/Data Requirements:
1 = -55°C to +125°C
2 = -40°C to +85°C
3 = 0°C to +70°C
4 = -55°C to +125°C with Variables Test Data
5 = -40°C to +85°C with Variables Test Data
8 = 0°C to +70°C with Variables Test Data
Option:
Blank = Standard Velocity Output (VEL)
T = Built-In-Test Output (LOS and LOR), instead of VEL
S = Synthesized Reference with Built-In-Test Output instead of VEL (Only
available with input option 6 or 8)
Input Option:
0 = 11.8 V, Synchro, 14 bit, 400 Hz
1 = 11.8 V, Resolver, 14 bit, 400 Hz
2 = 90 V, Synchro, 14 bit, 400 Hz
3 = 2 V, Direct, 14 bit, 400 Hz
4 = 90 V, Synchro, 14 bit, 60 Hz
5 = 11.8 V, Synchro, 16 bit, 400 Hz
6 = 11.8 V, Resolver, 16 bit, 400 Hz (1kHz with “S” option)
7 = 90 V, Synchro, 16 bit, 400 Hz
8 = 2 V, Direct 16 bit, 400 Hz (2V, Differential 16 Bit, 1kHz for option “S” only)
9 = 90 V, Synchro, 16 bit, 60 Hz
*Standard DDC Processing with burn-in and full temperature test—see TABLE 3 on next page.
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