![](http://datasheet.mmic.net.cn/300000/SE370C686Ayyz_datasheet_16210770/SE370C686Ayyz_56.png)
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POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
Contents
Page
3–3
3–3
3–3
3–4
3–4
Scope
Definitions
Device Sensitivity Per Test Circuit of Method 3015, MIL-STD-883C
Applicable Reference Documents
Facilities for Static-Free Workstation
Usage of Antistatic Solution in Areas to Control the Generation of Static
Charges
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ESD Labels and Signs in Work Areas
Relative Humidity Control
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Preparation for Working at Static-Free Workstation
General Handling Procedures and Requirements (for ESDS Devices and
Assemblies)
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Packaging Requirements
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Specific Handling Procedures for Static-Sensitive Items
Customer-Returned-Item Handling Procedure
Quality Control Provision
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3–5
3–6
3–6
3–6
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3–7
3–8
3–8
3–10
3–10
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