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參數(shù)資料
| 型號： | SE5019 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | 8-Bit mp-compatible D/A converter |
| 中文描述： | 8位手機兼容的D / A轉(zhuǎn)換 |
| 文件頁數(shù)： | 4/6頁 |
| 文件大?。?/td> | 69K |
| 代理商： | SE5019 |
Philips Semiconductors Linear Products
Product specification
NE/SE5018/5019
8-Bit
μ
p-compatible D/A converter
August 31, 1994
754
AC ELECTRICAL CHARACTERISTICS
1
V
CC
=
±
15V, T
A
= 25
°
C
SYMBOL
PARAMETER
TO
FROM
TEST CONDITIONS
NE/SE5018/19
Min
Typ
UNIT
Max
t
SLH
t
SHL
t
PLH
t
PHL
t
PLSB
t
PLH
t
PHL
t
S
t
H
t
PW
NOTES:
1. Refer to Figure 2.
2. See Figure 5.
3. See Figure 6.
4. See Figure 7.
5. See Figure 8.
6. See Figure 9.
7. For reference currents>3mA, use of an external buffer is required.
Settling time
±
1/2LSB
±
1/2LSB
Output
Input
All bits low-to-high
2
All bits high-to-low
3
All bits switched low-to-high
2
All bits switched high-to-low
3
1 LSB change
2, 3
Low-to-high transition
4
High-to-low transition
5
1.8
μ
s
μ
s
ns
Settling time
Input
2.3
Propagation delay
Input
300
Propagation delay
Output
Input
150
ns
Propagation delay
Output
Input
150
ns
Propagation delay
Output
LE
300
ns
Propagation delay
Output
LE
150
ns
Setup time
LE
Input
1, 6
100
ns
Hold time
Input
LE
1, 6
50
ns
Latch enable pulse width
1, 6
150
ns
Figure 1. DC Parametric Test Configuration
0.47
μ
F
MSB
LSB
9 8 7 6 5 4 3 2
10
19
1
22
18
20
21
15
17
16
12
13
14
DAC
5018
COMP
AMP
SUM
ANA GND
DIG GND
LE
V
REF
IN
V
REF
OUT
V
OUT
V
CC+
0.01
μ
F
0.1
μ
F
V
CC–
OUTPUT
2k
22pF
100pF
5.000V
Figure 2. AC Parametric Test Configuration
MSB
LSB
9 8 7 6 5 4 3 2
10
19
1
22
18
20
21
15
17
16
12
13
14
DAC
5018
COMP
AMP
SUM
ANA GND
DIG GND
OUTPUT
2k
22pF
1N914
0.47
μ
F
LE
V
OUT
V
CC+
0.01
μ
F
0.1
μ
F
V
CC–
V
REF
IN
V
REF
OUT
V
REF
ADJ
Figure 3. Full-/Zero-Scale Adjust — Unipolar Output (0–10V)
0.47
μ
F
MSB
LSB
10k
10T
80k
9 8 7 6 5 4 3 2
10
19
1
22
18
20
21
15
17
16
12
13
14
DAC
5018
COMP
AMP
SUM
ANA GND
DIG GND
LE
V
OUT
V
CC+
0.01
μ
F
0.1
μ
F
V
CC–
OUTPUT
2k
22pF
1N914
1M
V
CC+
20k
10T
V
CC–
ZADJUST
FADJUST
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