- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄378696 > SM5023 (Seiko NPC Corporation) Standard Crystals PDF資料下載
參數(shù)資料
| 型號： | SM5023 |
| 廠商： | Seiko NPC Corporation |
| 元件分類： | 晶體 |
| 英文描述： | Standard Crystals |
| 中文描述： | 標(biāo)準(zhǔn)晶體 |
| 文件頁數(shù)： | 5/9頁 |
| 文件大?。?/td> | 110K |
| 代理商： | SM5023 |
SM5023 series
NIPPON PRECISION CIRCUITS INC.—5
Electrical Characteristics
3V operation: SM5023BNDH, BNEH, CNDH
V
DD
= 2.7 to 3.6V, V
SS
= 0V, Ta =
20 to +80
°
C unless otherwise noted.
5V operation: SM5023BNDH, CNDH
V
DD
= 4.5 to 5.5V, V
SS
= 0V, Ta =
40 to +85
°
C unless otherwise noted.
Parameter
Symbol
Condition
Rating
Unit
min
typ
max
HIGH-level output voltage
V
OH
Q: Measurement cct 1, V
DD
= 2.7V I
OH
= 8mA
2.1
2.4
–
V
LOW-level output voltage
V
OL
Q: Measurement cct 2, V
DD
= 2.7V I
OL
= 8mA
–
0.3
0.5
V
HIGH-level input voltage
V
IH
INHN
2.0
–
–
V
LOW-level input voltage
V
IL
INHN
–
–
0.5
V
Output leakage current
I
Z
Q: Measurement cct 2, INHN = LOW
V
DD
= 3.3V
V
OH
= V
DD
–
–
10
μA
V
OL
= V
SS
–
–
10
μA
Current consumption
I
DD
Measurement cct 3, load cct 1, INHN = open, C
f = 70MHz
L
= 15pF
–
15
30
mA
INHN pull-up resistance
R
UP
Measurement cct 4
25
100
250
k
Built-in capacitance
C
G
Design value.
A monitor pattern on a wafer is tested.
SM5023BNDH
SM5023BNEH
7.44
8
8.56
pF
C
D
Design value.
A monitor pattern on a wafer is tested.
SM5023BNDH
13.95
15
16.05
pF
SM5023BNEH
11.16
12
12.84
pF
Parameter
Symbol
Condition
Rating
Unit
min
typ
max
HIGH-level output voltage
V
OH
Q: Measurement cct 1, V
DD
= 4.5V I
OH
= 16mA
3.9
4.2
–
V
LOW-level output voltage
V
OL
Q: Measurement cct 2, V
DD
= 4.5V I
OL
= 16mA
–
0.3
0.5
V
HIGH-level input voltage
V
IH
INHN
2.0
–
–
V
LOW-level input voltage
V
IL
INHN
–
–
0.8
V
Output leakage current
I
Z
Q: Measurement cct 2, INHN = LOW
V
DD
= 5.5V
V
OH
= V
DD
–
–
10
μA
V
OL
= V
SS
–
–
10
μA
Current consumption
I
DD1
Measurement cct 3, load cct 1,
INHN = open
C
f = 70MHz
L
= 15pF
–
20
40
mA
I
DD2
C
f = 50MHz
L
= 50pF
–
25
50
mA
INHN pull-up resistance
R
UP
Measurement cct 4
25
100
250
k
Built-in capacitance
C
G
Design value.
A monitor pattern on a wafer is tested.
SM5023BNDH
7.44
8
8.56
pF
C
D
Design value.
A monitor pattern on a wafer is tested.
SM5023BNDH
13.95
15
16.05
pF
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SM5023BNDH | Standard Crystals |
| SM5023BNEH | Standard Crystals |
| SM5023CNDH | Standard Crystals |
| SM5024 | Standard Crystals |
| SM5024AL1H | Standard Crystals |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SM5023BNDH | 制造商:NPC 制造商全稱:Nippon Precision Circuits Inc 功能描述:Miniature-package Crystal Oscillator Module ICs |
| SM5023BNEH | 制造商:NPC 制造商全稱:Nippon Precision Circuits Inc 功能描述:Miniature-package Crystal Oscillator Module ICs |
| SM5023CNDH | 制造商:NPC 制造商全稱:Nippon Precision Circuits Inc 功能描述:Miniature-package Crystal Oscillator Module ICs |
| SM5024 | 制造商:NPC 制造商全稱:Nippon Precision Circuits Inc 功能描述:Miniature-package Crystal Oscillator Module ICs |
| SM5024AL1H | 制造商:NPC 制造商全稱:Nippon Precision Circuits Inc 功能描述:Miniature-package Crystal Oscillator Module ICs |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。