參數(shù)資料
型號： SN54ABTH18646AHV
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
中文描述： 掃描測試設(shè)備與18位收發(fā)器和寄存器
文件頁數(shù)： 2/37頁
文件大?。?/td> 559K
代理商： SN54ABTH18646AHV
SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A
SCAN TEST DEVICES WITH
18-BIT TRANSCEIVERS AND REGISTERS
SCBS166D – AUGUST 1993 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
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SN74ABTH18646A, SN74ABTH182646A . . . PM PACKAGE
(TOP VIEW)
description
The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are
members of the Texas Instruments SCOPE
testability integrated-circuit family. This family of devices supports
IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed
transmission of data directly from the input bus or from the internal registers. They can be used either as two
9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot
samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating
the TAP in the normal mode does not affect the functional operation of the SCOPE
bus transceivers and
registers.
Transceiver function is controlled by output-enable (OE) and direction (DIR) inputs. When OE is low, the
transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR
is low. When OE is high, both the A and B outputs are in the high-impedance state, effectively isolating both
buses.
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is
clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data
is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for
presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB
and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that are performed with
the ’ABTH18646A and ’ABTH182646A.
相關(guān)PDF資料
PDF描述
SN54ABTH182646A Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置，帶18位收發(fā)器和寄存器)
SN54ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器)
SN74ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測裝置帶18位總線收發(fā)器和寄存器)
SN54ABTH18652A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器)
SN54ABTH245FK OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54ABTH18652A 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABTH18652AHV 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABTH245 制造商:TI 制造商全稱:Texas Instruments 功能描述:OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN54ABTH245FK 制造商:TI 制造商全稱:Texas Instruments 功能描述:OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN54ABTH245J 制造商:TI 制造商全稱:Texas Instruments 功能描述:OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
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