
SN54S8003, SN74S8003
DUAL 2-INPUT POSITIVE-NAND GATES
SCAS429 – JANUARY 1991–REVISED OCTOBER 1992
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS
77251–1443
Copyright
1992, Texas Instruments Incorporated
1
Typical V
OLP
(Output Ground Bounce) < 1 V
at V
CC
= 5 V, T
A
= 25
°
C
Package Options Include Plastic
Small-Outline Packages and Plastic DIPs
description
The ’S8003 contains two independent 2-input
NAND gates. It performs the Boolean functions
Y = A
B or Y = A + B in positive logic.
The SN54S8003 is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74S8003 is characterized for
operation from 0
°
C to 70
°
C.
FUNCTION TABLE
(each gate)
INPUTS
A
H
L
X
OUTPUT
B
H
X
L
Y
L
H
H
logic symbol
logic diagram (positive logic)
1A
1B
2A
2B
2
3
1
1Y
&
1
1A
2
1B
6
2A
7
2B
1Y
3
2Y
5
7
5
6
2Y
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
CC
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, V
I
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range: SN54S8003
SN74S8003
Storage temperature range
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
7 V
5.5 V
–55
°
C to 125
°
C
0
°
C to 70
°
C
–65
°
C to 150
°
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
1
2
3
4
8
7
6
5
1A
1B
1Y
GND
V
CC
2B
2A
2Y
SN74S8003 . . . D OR P PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.