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參數(shù)資料
| 型號： | SN74ABT8952DLG4 |
| 廠商： | Texas Instruments |
| 文件頁數(shù)： | 1/31頁 |
| 文件大小： | 0K |
| 描述： | IC SCAN TESST DEVICE 28-SSOP |
| 標準包裝： | 40 |
| 系列： | 74ABT |
| 邏輯類型： | 掃描測試設備，帶寄存總線收發(fā)器 |
| 電源電壓： | 4.5 V ~ 5.5 V |
| 位數(shù)： | 8 |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 28-BSSOP（0.295"，7.50mm 寬） |
| 供應商設備封裝： | 28-SSOP |
| 包裝： | 管件 |
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SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Members of the Texas Instruments
SCOPE
Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Functionally Equivalent to ’BCT2952 and
’ABT2952 in the Normal-Function Mode
D SCOPE Instruction Set
D IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP, and
HIGHZ
D Parallel-Signature Analysis at Inputs With
Masking Option
D Pseudo-Random Pattern Generation From
Outputs
D Sample Inputs/Toggle Outputs
D Binary Count From Outputs
D Even-Parity Opcodes
D Two Boundary-Scan Cells Per I/O for
Greater Flexibility
D State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Shrink
Small-Outline (DL) and Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Ceramic
DIPs (JT)
description
The ’ABT8952 scan test devices with octal
registered bus transceivers are members of the
Texas Instruments SCOPE
testability integra-
ted-circuit family. This family of devices supports
IEEE Standard 1149.1-1990 boundary scan to
facilitate testing of complex circuit-board assem-
blies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’BCT2952 and ’ABT2952 octal registered
bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE
octal registered bus transceivers.
Copyright
1996, Texas Instruments Incorporated
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-
ΙΙB are trademarks of Texas Instruments Incorporated.
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CLKAB
CLKENAB
OEAB
A1
A2
A3
GND
A4
A5
A6
A7
A8
TDO
TMS
CLKBA
CLKENBA
OEBA
B1
B2
B3
B4
VCC
B5
B6
B7
B8
TDI
TCK
32 1
13 14
5
6
7
8
9
10
11
B7
B8
TDI
TCK
TMS
TDO
A8
OEBA
CLKENBA
CLKBA
CLKAB
CLKENAB
OEAB
A1
4
15 16 17 18
A3
GND
A4
A5
A6
A7
B1
B2
B3
B4
28 27 26
25
24
23
22
21
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19
12
A2
V
B5
B6
CC
SN54ABT8952 . . . JT PACKAGE
SN74ABT8952 . . . DL OR DW PACKAGE
(TOP VIEW)
SN54ABT8952 . . . FK PACKAGE
(TOP VIEW)
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SN74ABT8952DLR | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DLRG4 | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DW | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DWE4 | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DWG4 | 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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