參數(shù)資料
型號: SN74ABT8952DLR
廠商: Texas Instruments
文件頁數(shù): 26/31頁
文件大?。?/td> 0K
描述: IC SCAN TESST DEVICE 28-SSOP
標(biāo)準(zhǔn)包裝: 1,000
系列: 74ABT
邏輯類型: 掃描測試設(shè)備,帶寄存總線收發(fā)器
電源電壓: 4.5 V ~ 5.5 V
位數(shù): 8
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 28-BSSOP(0.295",7.50mm 寬)
供應(yīng)商設(shè)備封裝: 28-SSOP
包裝: 帶卷 (TR)
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
A1–A8
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1–B8
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CLKAB, CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
CLKENAB, CLKENBA
Normal-function clock-enable inputs. See function table for normal-mode logic.
GND
Ground
OEAB, OEBA
Normal-function output-enable inputs. See function table for normal-mode logic.
TCK
Test clock. One of four pins required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous
to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four pins required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left
unconnected.
TDO
Test data output. One of four pins required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four pins required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
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