參數(shù)資料
型號: SN74LVC1G02NYEAREP
廠商: TEXAS INSTRUMENTS INC
元件分類: 門電路
英文描述: LVC/LCX/Z SERIES, 2-INPUT NOR GATE, BGA5
封裝: DSBGA-5
文件頁數(shù): 1/12頁
文件大小: 318K
代理商: SN74LVC1G02NYEAREP
www.ti.com
FEATURES
3
2
4
5
1
A
V
CC
Y
B
GND
DBV
PACKAGE
(A)
(TOP VIEW)
YEA
, YEP
, YZA
,
(A)
OR YZP
PACKAGE
(A)
(BOTTOMVIEW)
DCKPACKAGE
(TOP VIEW)
3
2
4
5
1
A
V
CC
Y
B
GND
DRL
PACKAGE
(A)
(TOP VIEW)
Seemechanicaldrawingsfordimensions.
A
GND
V
CC
Y
B
1
4
2
3
5
3
2
4
5
1
A
Y
B
GND
V
CC
DESCRIPTION/ORDERING INFORMATION
SINGLE 2-INPUT POSITIVE-NOR GATE
SGLS370 – AUGUST 2006
Supports 5-V V
CC Operation
Controlled Baseline
Inputs Accept Voltages to 5.5 V
– One Assembly
Max t
pd of 3.6 ns at 3.3 V
– One Test Site
Low Power Consumption, 10-
A Max I
CC
– One Fabrication Site
±24-mA Output Drive at 3.3 V
Extended Temperature Performance of –55
°C
I
off Supports Partial-Power-Down Mode
to 125
°C
Operation
Enhanced Diminishing Manufacturing
Latch-Up Performance Exceeds 100 mA Per
Sources (DMS) Support
JESD 78, Class II
Enhanced Product-Change Notification
ESD Protection Exceeds JESD 22
Qualification Pedigree (1)
– 2000-V Human-Body Model (A114-A)
Available in the Texas Instruments
– 200-V Machine Model (A115-A)
NanoStar and NanoFree Packages
– 1000-V Charged-Device Model (C101)
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
A.
Product Preview
This single 2-input positive-NOR gate is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC1G02 performs the Boolean function Y = A + B or Y = A
× B in positive logic.
NanoStar and NanoFree package technology is a major breakthrough in IC packaging concepts, using the
die as the package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright 2006, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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