參數(shù)資料
型號(hào): SPT1175ACN
廠商: Electronic Theatre Controls, Inc.
英文描述: 8-BIT, 20 MSPS CMOS A/D CONVERTER
中文描述: 8位,20 MSPS的的CMOS A / D轉(zhuǎn)換
文件頁數(shù): 3/8頁
文件大?。?/td> 76K
代理商: SPT1175ACN
SPT
3
6/24/97
SPT1175
ELECTRICAL SPECIFICATIONS
T
A
=+25
°
C, AV
DD
=DV
DD
=+5.0 V, AGND=DGND=0.0 V, V
RB
=+0.6 V and V
RT
=+2.6 V, unless otherwise specified.
TEST
CONDITIONS
TEST
LEVEL
SPT1175
TYP
PARAMETERS
MIN
MAX
UNITS
Dynamic Performance
Signal-To-Noise Ratio
f
IN
=1.0 MHz
f
IN
=3.58 MHz
f
IN
=10 MHz
Spurious Free
Dynamic Range
f
IN
=1.0 MHz
f
IN
=3.58 MHz
f
IN
=10 MHz
Differential Phase
Differential Gain
Digital Inputs
Input Current, Logic High
Input Current, Logic Low
Pulse Width High (CLK)
Pulse Width Low (CLK)
Voltage, Logic High
Voltage, Logic Low
Digital Outputs
Output Current, High
Output Current, Low
Output Current, High Z
Voltage High
Voltage Low
Power Supply Requirements
Analog Supply Voltage (AV
DD
)
Digital Supply Voltage (DV
DD
)
Supply Voltage Difference
Supply Current
Power Dissipation
f
S
= 20 MSPS
I
I
44
43
46
45
39
dB
dB
dB
V
f
S
= 20 MSPS
I
I
44
41
47
44
33
0.7
1.0
dB
dB
dB
Degrees
%
V
V
V
NTSC 20 IRE Mod Ramp
f
S
= 14.3 MSPS
V
DD
= 5.25 V, V
IH
= V
DD
V
DD
= 5.25 V, V
IL
= DGND
I
I
1.0
1.0
μ
A
μ
A
ns
ns
V
V
IV
IV
I
I
15
15
4.0
1.0
V
DD
= 4.75 V
V
DD
= 4.75 V
V
DD
= 5.25 V,
OE
= V
DD
IV
IV
IV
I
I
-1.1
3.5
mA
mA
μ
A
V
V
16
4.0
0.4
IV
IV
IV
I
I
+4.75
+4.75
-0.1
+5.0
+5.0
0.0
18
90
+5.25
+5.25
0.1
V
V
V
mA
mW
(AV
DD
-DV
DD
)
f
S
=20 MSPS
27
135
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25
°
C, and sample tested
at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25
°
C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
TEST LEVEL CODES
All electrical characteristics are subject to the following
conditions:
All parameters having min/max specifications are guar-
anteed. The Test Level column indicates the specific
device testing actually performed during production
and Quality Assurance inspection. Any blank section in
the data column indicates that the specification is not
tested at the specified condition.
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