參數(shù)資料
型號(hào): SPT7610SIQ
廠商: TOKO INC
元件分類(lèi): ADC
英文描述: 1-CH 6-BIT FLASH METHOD ADC, PARALLEL ACCESS, CQFP44
封裝: HERMETIC SEALED, CERQUAD-44
文件頁(yè)數(shù): 4/10頁(yè)
文件大?。?/td> 102K
代理商: SPT7610SIQ
SPT
3
12/19/00
SPT7610
ELECTRICAL SPECIFICATIONS
TA = TMIN to TMAX, AVEE = –5.2 V, VRB = –1.00 V, VRM = –0.5 V, VRT = 0.00 V, CLK = 1000 MSPS, Duty Cycle = 50%, unless otherwise specified.
TEST
SPT7610
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Timing Characteristics
Clock to Data Ready delay (tdr)
+25 °C case
V
950
ps
Clock to Output Data (tod)
+25 °C case
V
1.25
ns
Output Data to Data Ready (todr)
–40 to 85 °C case
IV
550
750
950
ps
Output Data Skew (tosk)
–40 to 85 °C case
IV
–150
150
ps
Aperture Jitter
V
2
ps
Acquisition Time
V
250
ps
Dynamic Performance
Spurious Free Dynamic Range (SFDR)
IN = 250 MHz
V
45
dB
IN = 400 MHz
V
34
dB
Signal-to-Noise and Distortion (SINAD)
IN = 250 MHz
VI
31
34
dB
IN = 400 MHz
VI
28
32
dB
Signal to Noise Ratio (SNR)
IN = 250 MHz
VI
33
36
dB
IN = 400 MHz
VI
32
36
dB
Total Harmonic Distortion (THD)
IN = 250 MHz
VI
–40
–37
dB
IN = 400 MHz
VI
–34
–30
dB
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Unless otherwise noted, all test are pulsed
tests; therefore, TJ = TC = TA.
LEVEL
TEST PROCEDURE
I
100% production tested at the specified temperature.
II
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
III
QA sample tested only at the specified temperatures.
IV
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
V
Parameter is a typical value for information purposes only.
VI
100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
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