參數(shù)資料
型號: SPT7730SCU
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: ADC
英文描述: 1-CH 8-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, UUC8
封裝: DIE
文件頁數(shù): 3/8頁
文件大?。?/td> 82K
代理商: SPT7730SCU
3
12/19/97
SPT7730
ELECTRICAL SPECIFICATIONS
TA = +25 °C, VDD = +5.0 V, VIN = 0 to +3 V, fCLK = 36 MHz, fS = 3.0 MSPS, VREF+ = +3.0 V, VREF- = 0.0 V, unless otherwise specified.
TEST
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Dynamic Performance
Effective Number of Bits
fIN = 500 kHz
IV
7.5
Bits
Signal-to-Noise Ratio
fIN = 500 kHz
IV
47
dB
Harmonic Distortion
fIN = 500 kHz
IV
60
dB
Power Supply Requirements3
+VDD Supply Voltage
IV
3
5.5
V
+VDD Supply Current
VDD = 3.0 V
IV
5.4
7
mA
VDD = 5.0 V
I
9
10
mA
Power Dissipation
VDD = 3.0 V
IV
16
22
mW
VDD = 5.0 V
I
45
50
mW
3Excluding the reference ladder.
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA=25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
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