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The ST24/25x08 are 8 Kbit electrically erasable
programmable memories (EEPROM), organized
as 4 blocks of 256 x8 bits. They are manufactured
in STMicroelectronics’s Hi-Endurance Advanced
CMOS technology which guarantees an endur-
ance of one million erase/write cycles with a data
retention of 40 years.
Both Plastic Dual-in-Line and Plastic Small Outline
packages are available.
The memories are compatible with the I2C stand-
ard, two wire serial interface which uses a bi-direc
-
tional data bus and serial clock. The memories
carry a built-in 4 bit, unique device identification
code (1010) corresponding to the I2C bus defini-
tion. This is used together with 1 chip enable input
(E) so that up to 2 x 8K devices may be attached
to the I2C bus and selected individually. The memo-
ries behave as a slave device in the I2C protocol
with all memory operations synchronized by the
serial clock. Read and write operations are initiated
by a START condition generated by the bus master.
The START condition is followed by a stream of 7
bits (identification code 1010), plus one read/write
bit and terminated by an acknowledge bit.
SDA
VSS
SCL
MODE/WC
NC
PRE
VCC
E
AI00861E
ST24x08
ST25x08
1
2
3
4
8
7
6
5
Figure 2A. DIP Pin Connections
1
AI01073E
2
3
4
8
7
6
5
SDA
VSS
SCL
MODE/WC
NC
PRE
VCC
E
ST24x08
ST25x08
Figure 2B. SO Pin Connections
DESCRIPTION (cont’d)
Symbol
Parameter
Value
Unit
TA
Ambient Operating Temperature
–40 to 125
°C
TSTG
Storage Temperature
–65 to 150
°C
TLEAD
Lead Temperature, Soldering
(SO8 package)
(PSDIP8 package)
40 sec
10 sec
215
260
°C
VIO
Input or Output Voltages
–0.6 to 6.5
V
VCC
Supply Voltage
–0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model)
(2)
4000
V
Electrostatic Discharge Voltage (Machine model)
(3)
500
V
Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings"
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not i mplied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other
relevant quality documents.
2. MIL-STD-883C, 3015.7 (100pF, 1500
).
3. EIAJ IC-121 (Condition C) (200pF, 0
).
Table 2. Absolute Maximum Ratings (1)
Warning: NC = Not Connected.
2/16
ST24/25C08, ST24/25W08