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參數(shù)資料
| 型號(hào)： | ST72623F2M1L |
| 廠商： | STMICROELECTRONICS |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 8-BIT, MROM, 4 MHz, MICROCONTROLLER, PDSO34 |
| 封裝： | PLASTIC, SO-34 |
| 文件頁(yè)數(shù)： | 27/136頁(yè) |
| 文件大?。?/td> | 2475K |
| 代理商： | ST72623F2M1L |
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ADC CHARACTERISTICS (Cont’d)
ADC Accuracy with fCPU=8 MHz, fADC=4 MHz RAIN< 10k
Figure 86. ADC Accuracy Characteristics
Notes:
1) Not tested in production, guaranteed by characterization.
2) ADC Accuracy vs. Negative Injection Current:
Injecting negative current on any of the analog input pins significantly reduces the accuracy of the conversion being per-
formed on another analog input.
For IINJ-=0.8mA, the typical leakage induced inside the die is 1.6A and the effect on the ADC accuracy is a loss of 4 LSB
for each 10K
increase of the external analog source impedance. It is recommended to add a Schottky diode (pin to
ground) to analog pins which may potentially inject negative current. Any positive injection current within the limits spec-
Symbol
Parameter
Conditions
Typ
Max
Unit
|ET|
Total unadjusted error
VDD= 4V-5.5V
3 1)
LSB
|EO|
Offset error
1 1)
2 1)
|EG|
Gain Error
0.7 1)
2 1)
|ED|
Differential linearity error
1.3 1)
2 1)
|EL|
Integral linearity error
2.9 1)
5 1)
EO
EG
1LSBIDEAL
1LSB
IDEAL
V
V
SSA
–
1024
-----------------------------------------
=
Vin (LSBIDEAL)
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset Error: deviation between the first actual
transition and the first ideal one.
EG=Gain Error: deviation between the last ideal
transition and the last actual one.
ED=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
EL=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
Digital Result ADCDR
1023
1022
1021
5
4
3
2
1
0
7
6
1
234
567
1021 1022 1023 1024
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
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