參數(shù)資料
型號: STM32F103VEH6
廠商: STMICROELECTRONICS
元件分類: 微控制器/微處理器
英文描述: 32-BIT, FLASH, 72 MHz, RISC MICROCONTROLLER, PBGA100
封裝: 10 X 10 MM, 0.50 MM PITCH, ROHS COMPLIANT, LFBGA-100
文件頁數(shù): 3/115頁
文件大?。?/td> 1225K
代理商: STM32F103VEH6
Electrical characteristics
STM32F103xC, STM32F103xD, STM32F103xE
5.3.20
Temperature sensor characteristics
Amplifier
gain
Gain of the amplifier in open
loop
80
85
dB
with a 5 k
Ω load (worst case)
tSETTLING
Settling time (full scale: for an
10-bit input code transition
between the lowest and the
highest input codes when
DAC_OUT reaches final value
±1LSB
34
s
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
Update
rate
Max frequency for a correct
DAC_OUT change when small
variation in the input code (from
code i to i+1LSB)
1MS/s
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
tWAKEUP
Wakeup time from off state
(PDV18 from 1 to 0)
6.5
10
s
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
input code between lowest and
highest possible ones.
PSRR+
Power supply rejection ratio (to
VDD33A) (static DC
measurement
–67
–40
dB
No RLOAD, CLOAD = 50 pF
1.
Guaranteed by characterization, not tested in production.
Table 62.
DAC characteristics (continued)
Symbol
Parameter
Min
Typ
Max(1)
Unit
Comments
Table 63.
TS characteristics
Symbol
Parameter
Min
Typ
Max
Unit
TL
(1)
VSENSE linearity with temperature
±1
±2
°C
Avg_Slope(1)
Average slope
4.0
4.3
4.6
mV/°C
Voltage at 25 °C
1.34
1.43
1.52
V
tSTART
(2)
Startup time
4
10
s
TS_temp
ADC sampling time when reading the
temperature
17.1
s
1.
Guaranteed by characterization, not tested in production.
2.
Guaranteed by design, not tested in production.
3.
Shortest sampling time can be determined in the application by multiple iterations.
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