hbwhelp@micrel.com or (408) 955-1690 AC Electrical C" />
參數(shù)資料
型號: SY89296UMI
廠商: Micrel Inc
文件頁數(shù): 17/17頁
文件大?。?/td> 0K
描述: IC DELAY LINE 1024TAP 32-MLF
標(biāo)準(zhǔn)包裝: 60
系列: Precision Edge®
標(biāo)片/步級數(shù): 1024
功能: 可編程
延遲到第一抽頭: 3.2ns
接頭增量: 10ps
可用的總延遲: 3.2ns ~ 14.8ns
獨立延遲數(shù): 1
電源電壓: 2.375 V ~ 3.6 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 32-VFQFN 裸露焊盤,32-MLF?
供應(yīng)商設(shè)備封裝: 32-MLF?(5x5)
包裝: 管件
Micrel, Inc.
SY89296U
November 2011
9
M9999-112211
hbwhelp@micrel.com or (408) 955-1690
AC Electrical Characteristics
(7) (Continued)
TA = –40°C to +85°C, unless otherwise stated.
Symbol
Parameter
Condition
Min.
Typ.
Max.
Units
Set-Up Time
D t+o LEN
Note 10
200
D to IN
Note 11
350
tS
/EN to IN
300
ps
Hold Time
LEN to D
200
tH
IN to /EN
Note 12
400
ps
Release Time
/EN to IN
500
SETMAX to LEN
500
tR
SETMIN to LEN
450
ps
Cycle-to-Cycle Jitter
Note 13
2
psRMS
Total Jitter
Note 14
10
psPP
tJITTER
Random Jitter
Note 15
1
psRMS
20% to 80% (Q)
50
85
160
ps
tr, tf
Output Rise/Fall Time
20% to 80% (CASCADE)
90
300
ps
Duty Cycle
45
55
%
fT
FTUNE
0
≤ FTUNE ≤ 1.25V
47
52
Ps/V
Notes:
10. This setup time defines the amount of time prior to the input signal. The delay tap of the device must be set.
11. This setup time defines the amount of the time that /EN must be asserted prior to the next transition of IN, /IN to prevent an output response greater
than
±75mV to the IN, /IN transition.
12. Hold time is the minimum time that /EN must remain asserted after a negative going IN or a positive going /IN to prevent an output response
greater than
±75mV to that IN, /IN transition .
13. Cycle-to-cycle jitter definition: the variation of periods between adjacent cycles over a random sample of adjacent cycle pairs
Tjitter_cc = Tn Tn + 1, where T is the time between rising edges of the output signal.
14. Total jitter definition: with an ideal clock input, no more than one output edge in 10
12 output edges will deviate by more than the specified peak-to-
peak jitter value.
15. Random jitter definition: jitter that is characterized by a Gaussian distribution, unbounded and is quantified by its standard deviation and mean.
Random jitter is measured with a K28.7 comma defect pattern, measured at 1.5Gbps.
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