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參數(shù)資料
| 型號： | TA1218N |
| 廠商： | Toshiba Corporation |
| 英文描述： | TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic |
| 中文描述： | 東芝雙極線性集成電路硅單片 |
| 文件頁數(shù)： | 34/40頁 |
| 文件大?。?/td> | 637K |
| 代理商： | TA1218N |
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TA1218N/F
2000-09-11 34/40
Characteristics
Select Mode
Symbol
Test
Circuit
Min.
Typ.
Max.
Unit
Test Method
L
in
TV
VDR5L2
6.0
6.5
V
p-p
L
in
V1
VDR8L2
6.0
6.5
V
p-p
L
in
V2
VDR29L2
6.0
6.5
V
p-p
L
in
S1
VDR11L2
6.0
6.5
V
p-p
L
out
2
Input dynamic range
L
in
S2
VDR15L2
6.0
6.5
V
p-p
(1) Apply a 1 kHz sine
wave to each input
pin.
(2) In each select
mode, measure an
input amplitude at
which the output
waveform on pin 1
begins to be
distorted.
L
in
TV
G5L2
0.5
0
0.5
dB
L
in
V1
G8L2
0.5
0
0.5
dB
L
in
V2
G29L2
0.5
0
0.5
dB
L
in
S1
G11L2
0.5
0
0.5
dB
L
out
2
Gain
L
in
S2
G15L2
0.5
0
0.5
dB
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, find the gain
between input and
output.
(1) Apply a 1.0 V
p-p
sine wave to each
input pin.
(2) In each select
mode, measure a
frequency at which
the output
amplitude on pin 1
is 3dB down from
the 1 kHz applied
level.
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, compare
signal output from
the selected pin
with leakage
components from
nonselected pins
to find a crosstalk.
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, compare
the output
amplitudes on pin
1 (43) when mute
is turned on and
turned off to find
mute attenuation.
L
in
TV
F5L2
0.1
2.0
MHz
L
in
V1
F8L2
0.1
2.0
MHz
L
in
V2
F29L2
0.1
2.0
MHz
L
in
S1
F11L2
0.1
2.0
MHz
L
out
2
Frequency response
L
in
S2
F15L2
0.1
2.0
MHz
L
in
TV
CT5L2
70
100
dB
L
in
V1
CT8L2
70
100
dB
L
in
V2
CT29L2
70
100
dB
L
in
S1
CT11L2
70
100
dB
L
out
2
Crosstalk
L
in
S2
CT15L2
70
100
dB
L
in
TV
M5L2
70
100
dB
L
in
V1
M8L2
70
100
dB
L
in
V2
M29L2
70
100
dB
L
in
S1
M11L2
70
100
dB
L
out
2
Mute attenuation
L
in
S2
M15L2
70
100
dB
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