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參數(shù)資料
| 型號(hào)： | TC520ACOE |
| 廠商： | TelCom Semiconductor, Inc. |
| 英文描述： | SERIAL INTERFACE ADAPTER FOR TC500 A/D CONVERTER FAMILY |
| 中文描述： | 串行接口適配器TC500的A / D轉(zhuǎn)換器系列 |
| 文件頁數(shù)： | 2/8頁 |
| 文件大小： | 81K |
| 代理商： | TC520ACOE |
3-40
TELCOM SEMICONDUCTOR, INC.
TC520A
SERIAL INTERFACE ADAPTER FOR
TC500 A/D CONVERTER FAMILY
ELECTRICAL CHARACTERISTICS:
V
DD
= 5V, f
osc
= 1 MHz, T
A
= +25
°
C, unless otherwise specified.
Symbol
Parameter
Min
Typ
Max
Unit
Supply
V
DD
I
DD
Input Characteristics
V
IL
V
IH
I
IL
I
PD
I
PU
Output Characteristics (I
OUT
= 250
μ
A, V
DD
= 5V)
V
OL
V
OH
t
R
, t
F
Oscillator (OSC
IN
, OSC
OUT
)
f
XTL
f
OSC
Timing Characteristics
t
RD
t
RS
t
DRS
t
LS
t
DLS
t
PWL
t
PWH
t
LDL
t
LDS
Parameter
t
IZ
t
AZI
Operating Voltage Range
Supply Current
4.5
—
5
5.5
1.5
V
0.8
mA
Low Input Voltage
High Input Voltage
Input Leakage Current
Pull-down Current (CE)
Pull-up Current (READ, LOAD)
—
2.0
—
—
—
—
—
—
5
5
0.8
—
10
—
—
V
V
μ
A
μ
A
μ
A
Low Output Voltage
High Output Voltage
C
L
= 10pF, Rise/Fall Times
—
3.5
—
0.2
4.3
—
0.3
—
250
V
V
nsec
Crystal Frequency
External Frequency (OSC
IN
)
—
—
1.0
—
4.0
6.0
MHz
MHz
READ Delay Time
Data Read Setup Time
D
CLK
to D
OUT
Delay
LOAD Setup Time
Data Load Setup Time
D
CLK
Pulse Width Low Time
D
CLK
Pulse Width High Time
Load Default Low Time
Load Default Setup Time
250
1
450
1
50
150
150
250
250
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
nsec
μ
sec
nsec
μ
sec
nsec
nsec
nsec
nsec
nsec
Integrator ZERO Time
Autozero (RESET) Time at Power-Up
—
—
0.5
100
—
—
msec
msec
ABSOLUTE MAXIMUM RATINGS*
DC Supply Voltage (V
DD
) ........................................ +6.0V
Input Voltage, All Inputs (V
IN
)............– 0.3V to V
DD
+0.3V
Operating Temperature Range (T
A
).............0
°
C to +70
°
C
Storage Temperature Range (T
STG
) .....– 65
°
C to +150
°
C
Lead Temperature (Soldering, 10 sec) (T
SDR
) ......+300
°
C
* Static-sensitive device. Unused devices must be stored in conductive
material. Protect devices from static discharge and static fields. Stresses
above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. These are stress ratings only and functional
operation of the device at these or any other conditions above those
indicated in the Operational Specifications is not implied. Any exposure to
Absolute Maximum Rating Conditions may affect device reliability.
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