3-48
TELCOM SEMICONDUCTOR, INC.
ELECTRICAL CHARACTERISTICS:
V
DD
= V
CCD
, C
AZ
= C
REF
= 0.47
μ
F, unless otherwise specified.
T
A
= +25
°
C
T
A
= 0
°
C to +70
°
C
Symbol
Parameter
Test Conditions
Min
Typ
Max
Min
Typ
Max
Unit
Analog
R
ZSE
Resolution
Zero-Scale Error
with Auto Zero Phase
End Point Linearity
Max Deviation from Best
Straight Line Fit
Zero-Scale Temperature
Coefficient
Roll-Over Error
Full-Scale Temperature
Coefficient
Input Current
Common-Mode
Voltage Range
Integrator Output Swing
Analog Input Signal Range
Voltage Reference Range
Zero Crossing Comparator
Note 1
—
—
—
—
±
17
0.5
—
—
—
±
17
0.012 % F.S.
Bits
0.005
ENL
NL
Note 1 and 2
Notes 1 and 2
—
—
0.015
0.008
0.030
0.015
—
—
0.015
—
0.045 % F.S.
—
% F.S.
ZS
TC
—
—
—
—
1
2
μ
V/
°
C
SYE
FS
TC
Note 3
Ext. V
REF
TC = 0ppm/
°
C
V
IN
= 0V
—
—
.012
—
—
—
—
—
.03
10
—
—
% F.S.
ppm/
°
C
I
IN
V
CMR
—
6
—
—
—
—
—
—
pA
V
V
SS
+ 1.5
V
DD
– 1.5
V
SS
+ 1.5
V
DD
– 1.5
V
INT
V
IN
V
REF
t
D
V
SS
+ 0.9
V
SS
+ 1.5
V
SS
+ 1
—
—
—
—
2.0
V
DD
– 0.9
V
SS
+ 0.9
V
DD
– 1.5
V
SS
+ 1.5
V
DD
– 1
V
DD
+ 1
—
—
—
—
3.0
V
DD
– 0.9
V
DD
– 1.5
V
DD
– 1
—
V
V
V
—
μ
sec
ABSOLUTE MAXIMUM RATINGS*
Supply Voltage ........................................................... +6V
Analog Input Voltage (V
+
Logic Input Voltage .................(V
DD
+ 0.3V) to (GND – 0.3V)
Ambient Operating Temperature Range
Plastic DIP Package .............................................. (C)
0
°
C to +70
°
C
SOIC Package
(C)..............................0
°
C to +70
°
C
PQFP Package
(C)..............................0
°
C to +70
°
C
Storage Temperature Range.................... – 65
°
C to +150
°
C
Lead Temperature (Soldering, 10 sec) ..................... +300
°
C
ELECTRICAL CHARACTERISTICS
IN
or V
–
IN
) ....................... V
DD
to V
SS
*Stresses beyond those listed under "Absolute Maximum Ratings" may
cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
T
A
= +25
°
C
T
A
= 0
°
C to +70
°
C
Symbol
Parameter
Test Conditions
Min
Typ
Max
Min
Typ
Max
Unit
V
DD
V
CCD
P
D
Analog Power Supply Voltage
Digital Power Supply Voltage
TC530/534 Total Power
Dissipation
Supply Current (V
S
+ P
IN
)
Supply Current (V
CCD
P
IN
)
4.5
4.5
—
5.0
5.0
—
5.5
5.5
25
4.5
4.5
—
—
—
—
5.5
5.5
—
V
V
V
DD
= V
CCD
= 5V
mW
I
S
I
CCD
—
—
1.8
—
2.5
1.5
—
—
—
—
3.0
1.7
mA
mA
f
OSC
= 1MHz
5V PRECISION DATA ACQUISITION
SUBSYSTEMS
TC530
TC534