參數(shù)資料
型號(hào): TC575502ECTRT
元件分類: 模擬信號(hào)調(diào)理
英文描述: SPECIALTY ANALOG CIRCUIT, PDSO5
封裝: SOT-23A, 5 PIN
文件頁(yè)數(shù): 3/10頁(yè)
文件大?。?/td> 64K
代理商: TC575502ECTRT
2
LINEAR REGULATOR CONTROLLER
TC57 Series
TC57-1
10/6/99
ABSOLUTE MAXIMUM RATINGS*
Voltage on VIN and EXT Pins ................................... +12V
Voltage on VOUT and SHDN Pins .....–0.3V to (VIN + 0.3V)
EXT Pin Current ...................................................... 50 mA
Operating Temperature Range (TC) ........ – 40°C to +85°C
Storage Temperature (TSTG) ................. – 40°C to +150°C
Power Dissipation ................................................ 150 mW
ELECTRICAL CHARACTERISTICS TC57EP3002 (NOTE 2): (SHDN = VIN, VIN = VOUT + 1V, VOUT = 3V to
5V, IOUT = 0, TA = 25°C, Test Circuit of Figure 1, unless otherwise noted.)
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
VIN
Input Voltage
8
V
VEXT
Voltage on EXT Output
8
V
VOUT
Output Voltage
IOUT = 50 mA (Note 1)
0.98 x VR VR ± 0.5% 1.02 x VR
V
VOUT
Load Regulation
1 mA
≤ IOUT ≤ 100 mA (Note 3)
–60
60
mV
VIN – VOUT
Dropout Voltage (Note 2)
IOUT = 100 mA
100
mV
IDD
Supply Current
VSHDN = VIN = 5V
50
80
A
ISHDN
Shutdown Supply Current
VSHDN = GND
0.6
A
VOUT/VIN Line Regulation
IOUT = 50 mA, 4V ≤ VIN ≤ 8V (Note 3)
0.1
0.3
%/V
VOUT/TVOUT Temp. Coefficient
IOUT = 10 mA, –40°C < TJ < +85°C—
±100
ppm/
°C
(Note 3)
ILEXT
EXT Pin Leakage Current
0.5
A
IEXT
EXT Sink Current
(Note 4)
25
mA
VIH
SHDN Input High Logic Threshold
1.5
V
VIL
SHDN Input Low Logic Threshold
0.25
V
IIH
SHDN Input Current @ VIH
VSHDN = VIN = 5V
0.1
A
IIL
SHDN Input Current @ VIL
VSHDN = GND
–0.2
–0.05
0
A
NOTES: 1. VR is the regulator output voltage setting.
2. Dropout voltage is defined as the input to output differential at which the output voltage drops 2% below its nominal value measured
at a 1V differential.
3. Varies with type of pass transistor used. Numbers shown are for the test circuit of Figure 1.
4. The product of IEXT x VEXT must be less than the maximum allowable power dissipation.
*Static-sensitive device. Unused devices must be stored in conductive
material. Protect devices from static discharge and static fields. Stresses
above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. These are stress ratings only and functional
operation of the device at these or any other conditions above those
indicated in the operational sections of the specifications is not implied.
Exposure to Absolute Maximum Rating Conditions for extended periods
may affect device reliability.
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