參數(shù)資料
型號: TC7116
廠商: Microchip Technology Inc.
英文描述: 3-1/2 Digit Analog-to-Digital Converters with Hold
中文描述: 3-1/2數(shù)字模擬數(shù)字轉(zhuǎn)換器與保持
文件頁數(shù): 2/14頁
文件大小: 218K
代理商: TC7116
3-204
TELCOM SEMICONDUCTOR, INC.
3-1/2 DIGIT ANALOG-TO-DIGITAL
CONVERTERS WITH HOLD
TC7116
TC7116A
TC7117
TC7117A
ABSOLUTE MAXIMUM RATINGS*
Supply Voltage
TC7116/TC7116A: V
+
to V
.................................15V
TC7117/TC7117A: V
+
to GND............................. +6V
V
to GND ............................– 9V
Analog Input Voltage (Either Input) (Note 1) ........ V
+
to V
Reference Input Voltage (Either Input)................. V
+
to V
Clock Input
TC7116/TC7116A.....................................TEST to V
+
TC7117/TC7117A...................................... GND to V
+
Package Power Dissipation, T
A
70
°
C (Note 2)
CerDIP ..............................................................2.29W
Plastic DIP ........................................................1.23W
Plastic Chip Carrier (PLCC)..............................1.23W
Plastic Quad Flat Package (PQFP) ..................1.00W
Operating Temperature
“C” Device..............................................0
°
C to +70
°
C
“I” Device ..........................................– 25
°
C to +85
°
C
Storage Temperature ............................– 65
°
C to +150
°
C
Lead Temperature (Soldering, 10 sec) .................+300
°
C
*Static-sensitive device. Unused devices must be stored in conductive
material. Protect devices from static discharge and static fields. Stresses
above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. These are stress ratings only and functional
operation of the device at these or any other conditions above those
indicated in the operational sections of the specifications is not implied.
Exposure to Absolute Maximum Rating Conditions for extended periods
may affect device reliability.
ELECTRICAL CHARACTERISTICS
(Note 3)
Parameter
Test Conditions
Min
Typ
Max
Unit
Zero Input Reading
V
IN
= 0V
Full Scale = 200 mV
V
IN
= V
REF
V
REF
= 100 mV
–V
IN
= +V
IN
200 mV or
2V
±
0
Digital
Reading
Digital
Reading
Counts
Ratiometric Reading
999
999/1000
1000
Roll-Over Error (Difference in
Reading for Equal Positive and
Negative Readings Near Full Scale)
Linearity (Maximum Deviation From
Best Straight Line Fit)
Common-Mode Rejection Ratio (Note 4)
– 1
±
0.2
+1
Full Scale = 200 mV or 2V
– 1
±
0.2
+1
Counts
V
CM
=
±
1V, V
IN
= 0V
Full Scale = 200 mV
V
IN
= 0V
Full Scale = 200 mV
V
IN
= 0V
V
IN
= 0V
“C” Device: 0
°
C to +70
°
C
“I” Device: –25
°
C to +85
°
C
V
IN
= 199 mV
“C” Device: 0
°
C to +70
°
C
(Ext Ref = 0 ppm/
°
C)
“I” Device: –25
°
C to +85
°
C
Note 6
TC7116/A Only
TC7117/A Only
Both
V
IN
= 0V
50
μ
V/V
Noise (Peak-to-Peak Value Not
Exceeded 95% of Time)
Leakage Current at Input
Zero Reading Drift
15
μ
V
1
10
pA
0.2
1
1
2
μ
V/
°
C
μ
v/
°
C
Scale Factor Temperature Coefficient
1
5
ppm/
°
C
30
70
0.8
20
ppm/
°
C
k
V
V
V
mA
Input Resistance, Pin 1
V
IL
, Pin 1
V
IL
, Pin 1
V
IH
, Pin 1
Supply Current (Does Not Include
LED Current for 7117/A)
Analog Common Voltage
(With Respect to Positive Supply)
Temperature Coefficient of Analog Common
(With Respect to Positive Supply)
Test +1.5
GND +1.5
1.8
V
+
– 1.5
25 k
Between Common
and Positive Supply
"C" Device: 0
°
C to +70
°
C
TC7116A/TC7117A
TC7116/TC7117
2.4
3.05
3.35
V
20
80
50
ppm/
°
C
ppm/
°
C
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