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參數(shù)資料
| 型號(hào)： | TDA1387T |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | DAC |
| 英文描述： | Stereo Continuous Calibration DAC CC-DAC |
| 中文描述： | SERIAL INPUT LOADING, 0.2 us SETTLING TIME, 16-BIT DAC, PDSO8 |
| 文件頁數(shù)： | 8/16頁 |
| 文件大?。?/td> | 140K |
| 代理商： | TDA1387T |
1995 Dec 11
8
Philips Semiconductors
Preliminary specification
Stereo Continuous Calibration DAC (CC-DAC)
TDA1387T
Notes
1.
2.
3.
V
ripple
= 1% of the supply voltage; f
ripple
= 100 Hz.
Values are proportional to V
DD
.
Measured with 1 kHz sine wave generated at a sampling rate of 192 kHz.
QUALITY SPECIFICATION
In accordance with “SNW-FQ-611E” The numbers of the quality specification can be found in the “Quality Reference
Handbook” The handbook can be ordered using the code 9397 750 00192.
Analog outputs; I
OL
and I
OR
RES
V
DCC
output resolution
DC output voltage
compliance
AC output signal current
(peak-to-peak value)
full-scale temperature
coefficient
output bias current
output reference voltage
output resistance at pin 7
total harmonic distortion
plus noise-to-signal ratio
0
16
3.5
bits
V
I
o(p-p)
note 2
0.86
1.0
1.14
mA
TC
FS
±
400
×
10
6
I
bias
V
ref
R
ref
(TDH + N)/S
note 2
note 2
0.93
7.6
1.08
1
6
V
DD
11.4
88
0.004
33
2.2
35
1.8
84
1.23
14.8
78
0.01
24
6
70
mA
V
k
dB
%
dB
%
dB
%
dB
at 0 dB signal level; note 3
at 0 dB signal level; note 3
at
60 dB signal level; note 3
at
60 dB signal level; note 3
at
60 dB; A-weighted; note 3
at
60 dB; A-weighted; note 3
f
i
= 20 Hz to 20 kHz;
at 0 dB signal level; note 3
f
i
= 20 Hz to 20 kHz;
at 0 dB signal level; note 3
0.006
0.03
%
t
cs
current settling time to
±
1 LSB
channel separation
unbalance between
outputs
delay time between outputs
signal-to-noise ratio at
bipolar zero
0.2
μ
s
α
cs
I
O
86
95
0.2
0.3
dB
dB
note 3
t
d
S/N
86
±
0.2
98
μ
s
dB
A-weighted at code 0000H
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
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