參數資料
型號： TLE4925C
廠商： INFINEON TECHNOLOGIES AG
元件分類： 模擬信號調理
英文描述： SPECIALTY ANALOG CIRCUIT, PSSS3
封裝： PLASTIC, SSO-3
文件頁數： 10/28頁
文件大小： 1066K
代理商： TLE4925C
Data Sheet
Page 18 of 28
10/02/2005
Noise
1
σ
Bdiff_typ
Bdiff_max
3
σ
B
B
Phase-Jitter
Figure17: Phase-Jitter
Systematic Phase Error
The systematic phase error includes the error due to the variation of the delay
time with temperature and the error caused by the resolution of the threshold. It
can be calculated in the following way:
d
t
n
°
=
60
360
d
... systematic phase error due to the variation of the delay time over temperature
in °
n
… speed of the camshaft wheel in min
-1
td
… variation of delay time over temperature in sec
Jitter (Repeatability)
The phase jitter is normally caused by the
analogue system noise. If there is an update
of the offset-DAC due to the algorithm, what
could happen after each tooth, then an
additional step in the phase occurs (see
description of the algorithm). This is not
included in the following calculations. The
noise is transformed through the slope of the
magnetic edge into a phase error. The phase
jitter is determined by the two formulas:
()
typ
neff
typ
Jitter
B
_
=
()
max
_
max
_
neff
Jitter
B
=
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