參數(shù)資料
型號： TLV5618ACP
廠商： TEXAS INSTRUMENTS INC
元件分類： DAC
英文描述： SERIAL INPUT LOADING, 3 us SETTLING TIME, 12-BIT DAC, PDIP8
封裝： ROHS COMPLIANT, PLASTIC, DIP-8
文件頁數(shù)： 18/23頁
文件大?。?/td> 633K
代理商： TLV5618ACP
TLV5618A
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230H – JULY 1999 – REVISED JULY 2002
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions (unless otherwise noted)
power supply
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VDD = 4.5 V to
Fast
1.8
2.5
mA
VDD 4.5 V to
55 V
mA
5.5 V
C&I
Slow
08
1
mA
5.5 V
C & I
Slow
0.8
1
I
Power supply current
No load, All inputs = AGND or
VDD = 2.7 V to
C & I
suffixes
Fast
1.6
2.2
mA
IDD
Power supply current
No load, All in uts = AGND or
VDD DAC latch = All ones
VDD 2.7 V to
33 V
Slow
06
09
mA
IDD
Power su
ly current
VDD, DAC latch = All ones
3.3 V
Slow
0.6
0.9
Fast
18
23
VDD = 2.7 V to
M & Q
Fast
1.8
2.3
mA
VDD 2.7 V to
5.5 V
M & Q
suffixes
Slow
0.8
1
mA
Power down supply current
1
A
PSRR
Power supply rejection ratio
Zero scale, See Note 2
–65
dB
PSRR
Power supply rejection ratio
Full scale,
See Note 3
–65
dB
NOTES:
2. Power supply rejection ratio at zero scale is measured by varying VDD and is given by:
PSRR = 20 log [(EZS(VDDmax) – EZS(VDDmin)/VDDmax]
3. Power supply rejection ratio at full scale is measured by varying VDD and is given by:
PSRR = 20 log [(EG(VDDmax) – EG(VDDmin)/VDDmax]
static DAC specifications
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
12
bits
INL
Integral nonlinearity
See Note 4
±2
±4
LSB
DNL
Differential nonlinearity
See Note 5
±0.5
±1
LSB
EZS
Zero-scale error (offset error at zero
scale)
See Note 6
±12
mV
EZS (TC)
Zero-scale-error temperature
coefficient
See Note 7
3
ppm/
°C
C & I suffixes
VDD = 4.5 V – 5.5 V
±0.29
%f ll
EG
Gain error
See Note 8
C & I suffixes
VDD = 2.7 V – 3.3 V
±0.6
% full
scale V
EG
Gain error
See Note 8
M & Q suffixes
VDD = 2.7 V – 5.5 V
±0.6
scale V
EG (TC)
Gain-error temperature coefficient
See Note 9
1
ppm/
°C
NOTES:
4. The relative accuracy of integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output
from the line between zero and full scale, excluding the effects of zero-code and full-scale errors.
5. The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal
1-LSB amplitude change of any two adjacent codes.
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
7. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) – EZS (Tmin)]/2Vref × 106/(Tmax – Tmin).
8. Gain error is the deviation from the ideal output (2Vref – 1 LSB) with an output load of 10 k.
9. Gain temperature coefficient is given by: EG TC = [EG (Tmax) – Eg (Tmin)]/2Vref × 106/(Tmax – Tmin).
output specifications
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VO
Output voltage range
RL = 10 k
0
VDD–0.4
V
Output load regulation accuracy
VO = 4.096 V, 2.048 V,
RL = 2 k to 10 k
±0.29
% FS
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