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參數資料
| 型號： | TLV5636ID |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 3.5 us SETTLING TIME, 12-BIT DAC, PDSO8 |
| 封裝： | GREEN, PLASTIC, MS-012AA, SOIC-8 |
| 文件頁數： | 19/23頁 |
| 文件大小： | 521K |
| 代理商： | TLV5636ID |
www.ti.com
ELECTRICAL CHARACTERISTICS
TIMING REQUIREMENTS
TLV5636
SLAS223C – JUNE 1999 – REVISED APRIL 2004
over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted)
ANALOG OUTPUT DYNAMIC PERFORMANCE
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Fast
1
3
RL = 10 k,
ts(FS)
Output settling time (full scale)
CL = 100 pF,
s
see note(1)
Slow
3.5
7
Fast
0.5
1.5
RL = 10 k,
ts(CC)
Output settling time, code to code
CL = 100 pF,
s
see note(2)
Slow
1
2
Fast
8
RL = 10 k,
SR
Slew rate
CL = 100 pF,
V/s
see note(3)
Slow
1.5
DIN = 0 to 1,
fout = 1 kHz,
Glitch energy
5
nV-s
CS = VDD
SNR
Signal-to-noise ratio
71
75
S/(N+D)
Signal-to-noise + distortion
59
66
fs = 480 kSPS,
fout = 1 kHz,
dB
RL = 10 k,
CL = 100 pF
THD
Total harmonic distortion
-67
-59
Spurious free dynamic range
59
69
(1)
Settling time is the time for the output signal to remain within +0.5 LSB of the final measured value for a digital input code change of
0x20 to 0xFDF and 0xFDF to 0x020 respectively. Assured by design; not tested.
(2)
Settling time is the time for the output signal to remain within +0.5 LSB of the final measured value for a digital input code change of one
count. Assured by design; not tested.
(3)
Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
DIGITAL INPUTS
MIN
NOM
MAX
UNIT
tsu(CS-FS)
Setup time, CS low before FS falling edge
10
ns
tsu(FS-CK)
Setup time, FS low before first negative SCLK edge
8
ns
Setup time, 16th negative edge after FS low on which bit D0 is sampled before
tsu(C16-FS)
10
ns
rising edge of FS.
Setup time, 16th positive SCLK edge (first positive after D0 is sampled) before CS
tsu(C16-CS)
rising edge. If FS is used instead of 16th positive edge to update DAC, then setup
10
ns
time between FS rising edge and CS rising edge.
twH
SCLK pulse duration high
25
ns
twL
SCLK pulse duration low
25
ns
tsu(D)
Setup time, data ready before SCLK falling edge
8
ns
th(D)
Hold time, data held valid after SCLK falling edge
5
ns
twH(FS)
FS duration high
25
ns
5
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