
TMS28F512A
65536 BY 8-BIT
FLASH MEMORY
SMJS514C – FEBRUARY 1994 – REVISED AUGUST 1997
1
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
Organization . . . 65536 by 8 Bits
All Inputs/Outputs TTL-Compatible
V
CC
Tolerance
±
10%
Maximum Access / Minimum Cycle Time
’28F512A-10
100 ns
’28F512A-12
120 ns
’28F512A-15
150 ns
’28F512A-17
170 ns
Industry-Standard Programming Algorithm
10000 and 1000 Program/Erase Cycles
Latchup Immunity of 250 mA on all Input
and Output Lines
Low Power Dissipation (V
CC
= 5.5 V)
– Active Write . . . 55 mW
– Active Read . . . 165 mW
– Electrical Erase . . . 82.5 mW
– Standby . . . 0.55 mW
(CMOS-Input Levels)
Automotive Temperature Range
– 40
°
C to 125
°
C
description
The TMS28F512A Flash memory is a 65536 by
8-bit (524 288-bit), programmable read-only
memory that can be electrically bulk-erased and
reprogrammed. It is available in 10000 and 1000
program/erase endurance cycle versions.
The TMS28F512A is offered in a 32-lead plastic
leaded chip-carrier package with 1,25-mm
(50-mil) lead spacing (FM suffix).
The TMS28F512A is characterized for operation
in temperature ranges of 0
°
C to 70
°
C (FML suffix),
–40
°
C to 85
°
C (FME suffix), and –40
°
C to 125
°
C
(FMQ suffix).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PIN NOMENCLATURE
A0–A15
DQ0–DQ7
E
G
NC
VCC
VPP
VSS
W
Address Inputs
Inputs (programming)/Outputs
Chip Enable
Output Enable
No Internal Connection
5-V Power Supply
12-V Power Supply
Ground
Write Enable
FM PACKAGE
(TOP VIEW)
3
2 1 32 31
14
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A14
A13
A8
A9
A11
G
A10
E
DQ7
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
4
30
15 16 17 18 19
D
D
D
D
D
A
A
N
P
W
N
20
D
V
V
Copyright
1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.