參數(shù)資料
型號: TPA0112PWPR
廠商: TEXAS INSTRUMENTS INC
元件分類: 音頻控制
英文描述: 2 CHANNEL(S), VOLUME CONTROL CIRCUIT, PDSO24
封裝: GREEN, PLASTIC, HTSSOP-24
文件頁數(shù): 22/34頁
文件大?。?/td> 655K
代理商: TPA0112PWPR
www.ti.com
C
PCB w
1
2p f
PCB
(100 kW)
(14)
INPUT MUX OPERATION
ROUT+
21
R
MUX
RHPIN
RLINEIN
+
23
20
8
RIN
ROUT
16
+
Volume
Control
Volume
Control
CIRHP
0.47
F
CIRLINE
0.47
F
Right
Headphone
Input Signal
Right Line
Input Signal
CRIN
0.47
F
SHUTDOWN MODES
TPA0112
SLOS204C – MAY 1999 – REVISED SEPTEMBER 2004
If it is desired to ac-couple the PC-BEEP input, the value of the coupling capacitor should be chosen to satisfy
Equation 14:
The PC BEEP input can also be dc-coupled to avoid using this coupling capacitor. The pin normally sits at
midrail when no signal is present.
Figure 48. TPA0112 Example Input MUX Circuit
The input MUX provides the user with a means to select from two different audio sources. In BTL mode, the
LINE inputs are selected. In SE mode, the HP inputs are selected. RIN and LIN must be ac grounded in SE mode.
The TPA0112 employs a shutdown mode of operation designed to reduce supply current, IDD, to the absolute
minimum level during periods of nonuse for battery-power conservation. The SHUTDOWN input terminal should
be held high during normal operation when the amplifier is in use. Pulling SHUTDOWN low causes the outputs to
mute and the amplifier to enter a low-current state, IDD = 150 A. SHUTDOWN should never be left unconnected
because amplifier operation would be unpredictable.
Table 6. SHUTDOWN AND MUTE MODE FUNCTIONS
INPUTS(1)
AMPLIFIER STATE
SE/BTL
SHUTDOWN
INPUT
OUTPUT
Low
High
Line
BTL
X(2)
Low
X(2)
Mute
High
HP
SE
(1)
Inputs should never be leftunconnected.
(2)
Stresses beyond thoselisted under absolute maximum ratings may cause permanent damage to the
device.These are stress ratings only, and functional operation of the device at theseor any other
conditions beyond those indicated under recommended operatingconditions is not implied. Exposure
to absolute-maximum-rated conditions forextended periods may affect device reliability.
29
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