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參數(shù)資料
| 型號： | TPA4411RTJT |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 音頻／視頻放大 |
| 英文描述： | 0.1 W, 2 CHANNEL, AUDIO AMPLIFIER, PQCC20 |
| 封裝： | 4 X 4 MM, GREEN, PLASTIC, TQFN-20 |
| 文件頁數(shù)： | 23/32頁 |
| 文件大?。?/td> | 1252K |
| 代理商： | TPA4411RTJT |
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www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
SLOS430E – AUGUST 2004 – REVISED MARCH 2008
TERMINAL FUNCTIONS
TERMINAL
I/O
DESCRIPTION
NAME
QFN
WCSP
C1P
1
A4
I/O
Charge pump flying capacitor positive terminal
PGND
2
B4
I
Power ground, connect to ground.
C1N
3
C4
I/O
Charge pump flying capacitor negative terminal
4, 6, 8,
NC
12, 16,
B3, C3
No connection
20
PVSS
5
D4
O
Output from charge pump.
SVSS
7
D3
I
Amplifier negative supply, connect to PVSS via star connection.
OUTL
9
D2
O
Left audio channel output signal
SVDD
10
D1
I
Amplifier positive supply, connect to PVDD via star connection.
OUTR
11
C2
O
Right audio channel output signal
INL
13
C1
I
Left audio channel input signal
SDR
14
B1
I
Right channel shutdown, active low logic.
INR
15
A1
I
Right audio channel input signal
SGND
17
A2
I
Signal ground, connect to ground.
SDL
18
B2
I
Left channel shutdown, active low logic.
PVDD
19
A3
I
Supply voltage, connect to positive supply.
Exposed Pad
-
Exposed pad must be soldered to a floating plane. Do NOT connect to power or ground.
over operating free-air temperature range, TA = 25°C (unless otherwise noted)
VALUE / UNIT
Supply voltage, AVDD, PVDD
–0.3 V to 5.5 V
VI
Input voltage
–0.3 V to VDD + 0.3 V
Output Continuous total power dissipation
See Dissipation Rating Table
TA
Operating free-air temperature range
–40
°C to 85°C
TJ
Operating junction temperature range
–40
°C to 150°C
Tstg
Storage temperature range
–65
°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
260
°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Copyright 2004–2008, Texas Instruments Incorporated
3
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