參數(shù)資料
型號: TS8387MFDSSC/SMD
元件分類: ADC
英文描述: 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP68
封裝: CERAMIC, QFP-68
文件頁數(shù): 2/38頁
文件大?。?/td> 617K
代理商: TS8387MFDSSC/SMD
TS8387
10/38
3.4.
EXPLANATION OF TEST LEVELS
D
100 % wafer tested at +25
°C (*)
I
100% production tested at +25
°C (*) (for packaged device).
II
100 % production tested at +25
°C (*), and sample tested at specified temperatures
III
Sample tested only at specified temperatures
IV
Parameter is guaranteed by design and characterization testing (thermal steady–state conditions
at specified temperature).
V
Parameter is a typical value only
VI
100 % production tested over specified temperature range.
Only MIN and MAX values are guaranteed (typical values are issuing from characterization results).
* Unless otherwise specified, all tests are pulsed tests : therefore Tj = Tc = Ta
3.5.
INDUSTRIAL WAFER SCREENING LIMITS
Parameter
Temperature
JTS8387 chip
Unit
Min
Max
DC Accuracy @ 50 MPSPS / 10 MHz
DNL
25
°C (*)
–0.56
+0.56
LSB
INL
25
°C ()
–1.23
+1.23
LSB
No missing codes
Guaranteed
AC Performance
@ TBD MPSPS / TBD MHz
25
°C (*)
SNR
25
°C ()
TBD
dB
ENOB
TBD
bit
* Unless otherwise specified, all tests are pulsed tests : therefore Tj = Tc = Ta
相關(guān)PDF資料
PDF描述
TS(X)8387CF 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP68
TS8387MF 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP68
TS8387CF 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP68
TS(X)8387CF 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP68
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